The DOI matches its Crossref record; 2 of the 2 references it cites were found in a registry or an index.
High-Performance WSe2 Field-Effect Transistors via Controlled Formation of In-Plane Heterojunctions
Abstract
Monolayer WSe2 is a two-dimensional (2D) semiconductor with a direct band gap, and it has been recently explored as a promising material for electronics and optoelectronics. Low field-effect mobility is the main constraint preventing WSe2 from becoming one of the competing channel materials for field-effect transistors (FETs). Recent results have demonstrated that chemical treatments can modify the electrical properties of transition metal dichalcogenides (TMDCs), including MoS2 and WSe2. Here, we report that controlled heating in air significantly improves device performance of WSe2 FETs in terms of on-state currents and field-effect mobilities. Specifically, after being heated at optimized conditions, chemical vapor deposition grown monolayer WSe2 FETs showed an average FET mobility of 31 cm(2)·V(-1)·s(-1) and on/off current ratios up to 5 × 10(8). For few-layer WSe2 FETs, after the same treatment applied, we achieved a high mobility up to 92 cm(2)·V(-1)·s(-1). These values are significantly higher than FETs fabricated using as-grown WSe2 flakes without heating treatment, demonstrating the effectiveness of air heating on the performance improvements of WSe2 FETs. The underlying chemical processes involved during air heating and the formation of in-plane heterojunctions of WSe2 and WO3-x, which is believed to be the reason for the improved FET performance, were studied by spectroscopy and transmission electron microscopy. We further demonstrated that, by combining the air heating method developed in this work with supporting 2D materials on the BN substrate, we achieved a noteworthy field-effect mobility of 83 cm(2)·V(-1)·s(-1) for monolayer WSe2 FETs. This work is a step toward controlled modification of the properties of WSe2 and potentially other TMDCs and may greatly improve device performance for future applications of 2D materials in electronics and optoelectronics.
Overview
The claims and statistics of this paper haven’t been checked yet.
Run the check — free, no account needed. It reads the open-access text and checks the sources it cites.
Integrity signals
Registry
Cites
Statistics
Verification
Claims the paper makes
The claims and statistics of this paper haven’t been checked yet.
Run the check — free, no account needed. It reads the open-access text and checks the sources it cites.
Self-check
Percentages, sums and reported differences re-computed from the paper’s own numbers.
The self-check needs the paper’s full text.
Citations
Cites
Xie, J., Zhang, J., Li, S., Grote, F., Zhang, X., Zhang, H., Wang, R., Lei, Y., Pan, B., & Xie, Y. (2013) · Journal of the American Chemical Society · doi:10.1021/ja408329q · Cited by 2,350
Controlled Synthesis of Highly Crystalline MoS 2 Flakes by Chemical Vapor Deposition
Wang, X., Feng, H., Wu, Y., & Jiao, L. (2013) · Journal of the American Chemical Society · doi:10.1021/ja4013485 · Cited by 748
Cited by
High Current Density in Monolayer MoS2 Doped by AlOx
McClellan, C. J., Yalon, E., Smithe, K. K. H., Suryavanshi, S. V., & Pop, E. (2021) · ACS Nano · doi:10.1021/acsnano.0c09078 · Cited by 267
Metadata
- Authors
- Liu, B., Ma, Y., Zhang, A., Chen, L., Abbas, A. N., Liu, Y., Shen, C., Wan, H., & Zhou, C.
- Venue
- ACS Nano
- Publisher
- American Chemical Society (ACS)
- Published
- 2016-05-09
- Volume
- 10
- Issue
- 5
- Pages
- 5153-5160
- ISSN
- 1936-0851 (ISSN-L)
- 1936-086X
- OpenAlex
- W2342569913
- Cited by
- 174
- References
- 2
- FWCI
- 8.00
- Type
- journal article
- Language
- en
- Open access
- closed
About these checks
Registry, retraction, Cites and statistics results are computed, not judged, with one exception: a printed reference that no index lists is read once by a model before it counts as a citation error. Claims are extracted by a model and kept only when their quote appears verbatim in the text; each cited source is then checked, with a model’s help, for whether it says what the claim relies on. Those verdicts can be wrong — read the claim’s quote and the cited source before relying on one.
Statistics and arithmetic are recomputed, not judged.
Confidence bands are shown only for fields calibrated on our annotated test set. None is calibrated yet, so no band is shown.
What counts as a claim ›How we measure confidence ›How we check this ›
Are you an author, or do you see a problem with this page? Request a review
How to cite
Cite CoChat for the checks on this page, and the paper for its own findings.
- This page
- CoChat. (2026). Citation check: High-Performance WSe2 Field-Effect Transistors via Controlled Formation of In-Plane Heterojunctions. https://app.cochat.ai/papers/10.1021/acsnano.6b00527
- The paper
- Liu, B., Ma, Y., Zhang, A., Chen, L., Abbas, A. N., Liu, Y., Shen, C., Wan, H., & Zhou, C. (2016). High-Performance WSe2 Field-Effect Transistors via Controlled Formation of In-Plane Heterojunctions. ACS Nano. https://doi.org/10.1021/acsnano.6b00527
Data sources
Bibliographic data: Semantic Scholar, OpenAlex, Crossref.
Contains information from the Semantic Scholar Academic Graph Datasets, made available under the ODC Attribution License (ODC-BY 1.0).
Semantic Scholar’s data is described in: Kinney, R., et al. (2023). The Semantic Scholar Open Data Platform. arXiv:2301.10140.