Student or educator? Sign up with your school email and get 6 months of Pro free.
Cited by 379

The DOI matches its Crossref record; 15 of the 15 references it cites were found in a registry or an index.

ZnO Nanowires Synthesized by Vapor Trapping CVD Method

Chang, Pai-Chun, Fan, Zhiyong, Wang, Dawei, Tseng, Wei-Yu, Chiou, Wen-An, Hong, Juan, Lu, Jia G.·2004·Chemistry of Materials

Abstract

A chemical vapor deposition (CVD) process modified with vapor trapping method has been used to synthesize n -type ZnO nanowires with high carrier concentration without incorporating impurity dopants. With this method, a spatial variation of synthesis condition was created and the donors were directly introduced into the nanowires during the synthesis process. Electron microscopy and electrical transport studies show that nanowires having distinct morphologies and electrical properties were obtained at different locations in the CVD system. The vapor trapping method elucidates the effect of synthesis conditions, and provides an approach to control nanowire growth for tailorable device applications.

Overview

The claims and statistics of this paper haven’t been checked yet.

Run the check — free, no account needed. It reads the open-access text and checks the sources it cites.

A few free checks a day · papers already verified open instantly · results are public

Integrity signals

Registry

Crossref · 10.1021/cm049182c

Cites

15 of 15 references verified0 citation errors · 0 not checkable

Statistics

Verification

Claims the paper makes

The claims and statistics of this paper haven’t been checked yet.

Run the check — free, no account needed. It reads the open-access text and checks the sources it cites.

A few free checks a day · papers already verified open instantly · results are public

Self-check

Percentages, sums and reported differences re-computed from the paper’s own numbers.

The self-check needs the paper’s full text.

Citations

Cites

Show all 15 references

Cited by

Metadata

Authors
Chang, P.-C., Fan, Z., Wang, D., Tseng, W.-Y., Chiou, W.-A., Hong, J., & Lu, J. G.
Venue
Chemistry of Materials
Published
2004-11-01
Volume
16
Issue
24
Pages
5133-5137
ISSN
  • 0897-4756 (ISSN-L)
  • 1520-5002
OpenAlex
W2043866529
Cited by
379
References
15
FWCI
6.46
Type
journal article
Language
en
Open access
closed

About these checks

Registry, retraction, Cites and statistics results are computed, not judged, with one exception: a printed reference that no index lists is read once by a model before it counts as a citation error. Claims are extracted by a model and kept only when their quote appears verbatim in the text; each cited source is then checked, with a model’s help, for whether it says what the claim relies on. Those verdicts can be wrong — read the claim’s quote and the cited source before relying on one.

Statistics and arithmetic are recomputed, not judged.

Confidence bands are shown only for fields calibrated on our annotated test set. None is calibrated yet, so no band is shown.

What counts as a claim ›How we measure confidence ›How we check this ›

Are you an author, or do you see a problem with this page? Request a review

Data sources

Bibliographic data: Semantic Scholar, OpenAlex, Crossref.

Contains information from the Semantic Scholar Academic Graph Datasets, made available under the ODC Attribution License (ODC-BY 1.0).

Semantic Scholar’s data is described in: Kinney, R., et al. (2023). The Semantic Scholar Open Data Platform. arXiv:2301.10140.