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Preparation and Evaluation of Graphite Oxide Reduced at 220 °C
Abstract
The reduction of graphite oxide (GO) thin films was evaluated at 220 °C using a combination of infrared (FTIR) and X-ray photoemission spectroscopies (XPS). The results were correlated with electrical resistance measurements. The chemical composition of GO was C 8 (OH) 3 O 0.8 and reduced to C 8 (OH) 0.5 O 0.3 after nearly 24 h of low-temperature processing, defined as 220 °C. The sheet resistance of dropcast GO thin films processed at 220 °C in air was 8 kΩ sq −1, similar to GO reduced at >800 °C in an inert atmosphere.
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Cites
The chemistry of graphene oxide
Dreyer, D. R., Park, S., Bielawski, C. W., & Ruoff, R. S. (2010) · Chem. Soc. Rev. · doi:10.1039/b917103g · Cited by 11,653
Cited by
Hammock, M. L., Chortos, A., Tee, B. C. ‐., Tok, J. B. ‐., & Bao, Z. (2013) · Advanced Materials · doi:10.1002/adma.201302240 · Cited by 2,396
Biological and chemical sensors based on graphene materials
Liu, Y., Dong, X., & Chen, P. (2012) · Chem. Soc. Rev. · doi:10.1039/c1cs15270j · Cited by 1,748
Li, Y., Zhang, H., Liu, P., Wang, D., Li, Y., & Zhao, H. (2013) · Small · doi:10.1002/smll.201203135 · Cited by 657
Graphene oxide and its reduction: modeling and experimental progress
Mao, S., Pu, H., & Chen, J. (2012) · RSC Advances · doi:10.1039/c2ra00663d · Cited by 522
Le, L. T., Ervin, M. H., Qiu, H., Fuchs, B. E., & Lee, W. Y. (2011) · Electrochemistry Communications · doi:10.1016/j.elecom.2011.01.023 · Cited by 420
Metadata
- Authors
- Zangmeister, C. D.
- Venue
- Chemistry of Materials
- Publisher
- American Chemical Society (ACS)
- Published
- 2010-09-09
- Volume
- 22
- Issue
- 19
- Pages
- 5625-5629
- ISSN
- 0897-4756 (ISSN-L)
- 1520-5002
- OpenAlex
- W2332433553
- Cited by
- 207
- References
- 1
- FWCI
- 7.72
- Type
- journal article
- Language
- en
- Open access
- closed
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