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Cited by 339

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Mapping of the Hot Spots for DNA Damage by One-Electron Oxidation: Efficacy of GG Doublets and GGG Triplets as a Trap in Long-Range Hole Migration

Saito, Isao, Nakamura, Takashi, Nakatani, Kazuhiko, Yoshioka, Yasunori, Yamaguchi, Kizashi, Sugiyama, Hiroshi·1998·Journal of the American Chemical Society

Abstract

ADVERTISEMENT RETURN TO ISSUEPREVCommunicationNEXTMapping of the Hot Spots for DNA Damage by One-Electron Oxidation: Efficacy of GG Doublets and GGG Triplets as a Trap in Long-Range Hole MigrationIsao Saito, Takashi Nakamura, Kazuhiko Nakatani, Yasunori Yoshioka, Kizashi Yamaguchi, and Hiroshi SugiyamaView Author Information Department of Synthetic Chemistry and Biological Chemistry, Faculty of Engineering Kyoto University, Kyoto 606, Japan CREST, Japan Science and Technology Corporation Department of Chemistry Graduate School of Science, Osaka University, Toyonaka, Osaka 560, Japan Institute for Medical and Dental Engineering Tokyo Medical & Dental University, Tokyo 101, Japan Cite this: J. Am. Chem. Soc. 1998, 120, 48, 12686–12687Publication Date (Web):November 20, 1998Publication History Received1 June 1998Published online20 November 1998Published inissue 1 December 1998https://pubs.acs.org/doi/10.1021/ja981888ihttps://doi.org/10.1021/ja981888irapid-communicationACS PublicationsCopyright © 1998 American Chemical SocietyRequest reuse permissionsArticle Views1388Altmetric-Citations305LEARN ABOUT THESE METRICSArticle Views are the COUNTER-compliant sum of full text article downloads since November 2008 (both PDF and HTML) across all institutions and individuals. These metrics are regularly updated to reflect usage leading up to the last few days.Citations are the number of other articles citing this article, calculated by Crossref and updated daily. Find more information about Crossref citation counts.The Altmetric Attention Score is a quantitative measure of the attention that a research article has received online. Clicking on the donut icon will load a page at altmetric.com with additional details about the score and the social media presence for the given article. Find more information on the Altmetric Attention Score and how the score is calculated. Share Add toView InAdd Full Text with ReferenceAdd Description ExportRISCitationCitation and abstractCitation and referencesMore Options Share onFacebookTwitterWechatLinked InRedditEmail Other access optionsGet e-AlertscloseSupporting Info (1)»Supporting Information Supporting Information SUBJECTS:Genetics,Irradiation,Lasers,Oxidation,Reactivity Get e-Alerts

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Metadata

Authors
Saito, I., Nakamura, T., Nakatani, K., Yoshioka, Y., Yamaguchi, K., & Sugiyama, H.
Venue
Journal of the American Chemical Society
Published
1998-11-20
Volume
120
Issue
48
Pages
12686-12687
ISSN
  • 0002-7863 (ISSN-L)
  • 1520-5126
OpenAlex
W2090685881
Cited by
339
References
2
FWCI
4.05
Type
journal article
Language
en
Open access
closed

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CoChat. (2026). Citation check: Mapping of the Hot Spots for DNA Damage by One-Electron Oxidation: Efficacy of GG Doublets and GGG Triplets as a Trap in Long-Range Hole Migration. https://app.cochat.ai/papers/10.1021/ja981888i
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Saito, I., Nakamura, T., Nakatani, K., Yoshioka, Y., Yamaguchi, K., & Sugiyama, H. (1998). Mapping of the Hot Spots for DNA Damage by One-Electron Oxidation: Efficacy of GG Doublets and GGG Triplets as a Trap in Long-Range Hole Migration. Journal of the American Chemical Society. https://doi.org/10.1021/ja981888i

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