The DOI matches its Crossref record; 10 of the 10 references it cites were found in a registry or an index.
Electrochemical and XPS Studies toward the Role of Monomeric and Polymeric Sulfonate Counterions in the Synthesis, Composition, and Properties of Poly(3,4-ethylenedioxythiophene)
Abstract
Electrochemically prepared poly(3,4-ethylenedioxythiophene) (PEDT) poly(styrenesulfonate) (PSS), produced from acidic (PSSH) and basic (PSSNa) PSS, was characterized by cyclic voltammetry CV, UV−vis spectroscopy, in situ conductivity, and XPS spectroscopy and was compared with electrochemically prepared PEDT/tosylate and chemically prepared PEDT/PSS. CV analysis shows that the polymer synthesis is strongly affected by the nucleophilic character of the counteranion. Although CV and UV−vis spectroscopy show that the structure and degree of polymerization (oligomeric, ca. 10 EDT units) of the PEDT backbone is the same for all polymers, XPS is able to explain the different conductivity values for these materials (ranging from 1 S cm -1 for PEDT/PSSNa to 400−450 S cm -1 for PEDT/tosylate) based on doping level and composition. In particular, critical results are observed to be the ratios between sulfonate and thiophene units in the polymers: the higher the PEDT concentration, the higher the conductivity. XPS also explains by solvent-induced nanometer-scale segregation between PEDT/PSS and excess PSS particles the often reported conductivity enhancement of chemically prepared PEDT/PSS upon treatment with polar solvents.
Overview
The claims and statistics of this paper haven’t been checked yet.
Run the check — free, no account needed. It reads the open-access text and checks the sources it cites.
Integrity signals
Registry
Cites
Statistics
Verification
Claims the paper makes
The claims and statistics of this paper haven’t been checked yet.
Run the check — free, no account needed. It reads the open-access text and checks the sources it cites.
Self-check
Percentages, sums and reported differences re-computed from the paper’s own numbers.
The self-check needs the paper’s full text.
Citations
Cites
Poly(3,4-ethylenedioxythiophene) and Its Derivatives: Past, Present, and Future
Groenendaal, L., Jonas, F., Freitag, D., Pielartzik, H., & Reynolds, J. R. (2000) · Advanced Materials · doi:10.1002/(sici)1521-4095(200004)12:7<481::aid-adma481>3.0.co;2-c · Cited by 3,420
Self-citation(1981) · Handbook of Exploration Geochemistry · doi:10.1016/b978-0-444-41930-9.50014-3 · Cited by 2,896
High resolution XPS of organic polymers The Scienta ESCA300 Database
Comyn, J. (1993) · International Journal of Adhesion and Adhesives · doi:10.1016/0143-7496(93)90011-w · Cited by 1,330
Brédas, J. L., Calbert, J. P., da Silva Filho, D. A., & Cornil, J. (2002) · Proceedings of the National Academy of Sciences · doi:10.1073/pnas.092143399 · Cited by 1,276
Bredas, J. L., Silbey, R., Boudreaux, D. S., & Chance, R. R. (1983) · Journal of the American Chemical Society · doi:10.1021/ja00360a004 · Cited by 1,238
Kim, J. Y., Jung, J. H., Lee, D. E., & Joo, J. (2002) · Synthetic Metals · doi:10.1016/s0379-6779(01)00576-8 · Cited by 1,072
The concept of secondary doping as applied to polyaniline
MacDiarmid, A. G., & Epstein, A. J. (1994) · Synthetic Metals · doi:10.1016/0379-6779(94)90171-6 · Cited by 889
Greczynski, G., Kugler, T., & Salaneck, W. R. (1999) · Thin Solid Films · doi:10.1016/s0040-6090(99)00422-8 · Cited by 423
Self-citationStructure of thin films of poly(3,4-ethylenedioxythiophene)
Aasmundtveit, K. E., Samuelsen, E. J., Pettersson, L. A. A., Inganäs, O., Johansson, T., & Feidenhans'l, R. (1999) · Synthetic Metals · doi:10.1016/s0379-6779(98)00315-4 · Cited by 423
Vibrational key bands and electrical conductivity of polythiophene
Furukawa, Y., Akimoto, M., & Harada, I. (1987) · Synthetic Metals · doi:10.1016/0379-6779(87)90870-8 · Cited by 353
Cited by
Electrochemistry of Conducting Polymers—Persistent Models and New Concepts
Heinze, J., Frontana-Uribe, B. A., & Ludwigs, S. (2010) · Chemical Reviews · doi:10.1021/cr900226k · Cited by 1,258
Resolving ruthenium: XPS studies of common ruthenium materials
Morgan, D. J. (2015) · Surface and Interface Analysis · doi:10.1002/sia.5852 · Cited by 1,199
Bubnova, O., Khan, Z. U., Wang, H., Braun, S., Evans, D. R., Fabretto, M., Hojati-Talemi, P., Dagnelund, D., Arlin, J.-B., Geerts, Y. H., et al. (2014) · Nature Materials · doi:10.1038/nmat3824 · Cited by 854
Self-citationNeural interfaces engineered via micro- and nanostructured coatings
Chen, N., Tian, L., Patil, A. C., Peng, S., Yang, I. H., Thakor, N. V., & Ramakrishna, S. (2017) · Nano Today · doi:10.1016/j.nantod.2017.04.007 · Cited by 74
Metadata
- Authors
- Zotti, G., Zecchin, S., Schiavon, G., Louwet, F., Groenendaal, L., Crispin, X., Osikowicz, W., Salaneck, W., & Fahlman, M.
- Venue
- Macromolecules
- Publisher
- American Chemical Society (ACS)
- Published
- 2003-04-11
- Volume
- 36
- Issue
- 9
- Pages
- 3337-3344
- ISSN
- 0024-9297 (ISSN-L)
- 1520-5835
- OpenAlex
- W2066839549
- Cited by
- 353
- References
- 10
- FWCI
- 5.22
- Type
- journal article
- Language
- en
- Open access
- closed
About these checks
Registry, retraction, Cites and statistics results are computed, not judged, with one exception: a printed reference that no index lists is read once by a model before it counts as a citation error. Claims are extracted by a model and kept only when their quote appears verbatim in the text; each cited source is then checked, with a model’s help, for whether it says what the claim relies on. Those verdicts can be wrong — read the claim’s quote and the cited source before relying on one.
Statistics and arithmetic are recomputed, not judged.
Confidence bands are shown only for fields calibrated on our annotated test set. None is calibrated yet, so no band is shown.
What counts as a claim ›How we measure confidence ›How we check this ›
Are you an author, or do you see a problem with this page? Request a review
Data sources
Bibliographic data: Semantic Scholar, OpenAlex, Crossref.
Contains information from the Semantic Scholar Academic Graph Datasets, made available under the ODC Attribution License (ODC-BY 1.0).
Semantic Scholar’s data is described in: Kinney, R., et al. (2023). The Semantic Scholar Open Data Platform. arXiv:2301.10140.
