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Unity-Order Index Change in Transparent Conducting Oxides at Visible Frequencies

Feigenbaum, Eyal, Diest, Kenneth, Atwater, Harry A.·2010·Nano Letters

Abstract

We report a method for obtaining unity-order refractive index changes in the accumulation layer of a metal-oxide-semiconductor heterostructure with conducting oxide as the active material. Under applied field, carrier concentrations at the dielectric/conducting oxide interface increase from 1 x 10(21)/cm(3) to 2.8 x 10(22)/cm(3), resulting in a local refractive index change of 1.39 at 800 nm. When this structure is modeled as a plasmonic waveguide, the change corresponds to a modal index change of 0.08 for the plasmonic mode.

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Metadata

Authors
Feigenbaum, E., Diest, K., & Atwater, H. A.
Venue
Nano Letters
Published
2010-05-18
Volume
10
Issue
6
Pages
2111-2116
ISSN
  • 1530-6984 (ISSN-L)
  • 1530-6992
OpenAlex
W1986224902
Cited by
534
References
0
FWCI
11.29
Type
journal article
Language
en
Open access
closed

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CoChat. (2026). Citation check: Unity-Order Index Change in Transparent Conducting Oxides at Visible Frequencies. https://app.cochat.ai/papers/10.1021/nl1006307
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Feigenbaum, E., Diest, K., & Atwater, H. A. (2010). Unity-Order Index Change in Transparent Conducting Oxides at Visible Frequencies. Nano Letters. https://doi.org/10.1021/nl1006307

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