The DOI matches its Crossref record; 1 of the 1 references it cites were found in a registry or an index.
Trapping of Metal Atoms in Vacancies of Carbon Nanotubes and Graphene
Abstract
Lattice defects in carbon nanotubes and graphene are created by focusing an electron beam in a scanning transmission electron microscope onto a 0.1 nm spot on the objects. Metal atoms migrating on the graphenic surfaces are observed to be trapped by these defects. Depending on the size of the defect, single metal atoms or clusters of several atoms can be localized in or on nanotubes or graphene layers. Subsequent escape of the metal atoms from the trapping centers gives information about the bonding between the metal atom and the defect. The process of trapping and detrapping is studied in a temperature range of 20-670 degrees C. The technique allows one to place metal atoms with almost atomic precision in graphenic structures and to create a predefined pattern of foreign atoms in graphene or carbon nanotubes.
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Citations
Cites
Graphene: Status and Prospects
Geim, A. K. (2009) · Science · doi:10.1126/science.1158877 · Cited by 13,942
Cited by
Structural Defects in Graphene
Banhart, F., Kotakoski, J., & Krasheninnikov, A. V. (2011) · ACS Nano · doi:10.1021/nn102598m · Cited by 3,340
Self-citationJiang, K., Siahrostami, S., Akey, A. J., Li, Y., Lu, Z., Lattimer, J., Hu, Y., Stokes, C., Gangishetty, M., Chen, G., et al. (2017) · Chem · doi:10.1016/j.chempr.2017.09.014 · Cited by 406
Shi, H., Auerbach, S. M., & Ramasubramaniam, A. (2016) · The Journal of Physical Chemistry C · doi:10.1021/acs.jpcc.6b01288 · Cited by 50
Metadata
- Authors
- Rodríguez-Manzo, J. A., Cretu, O., & Banhart, F.
- Venue
- ACS Nano
- Publisher
- American Chemical Society (ACS)
- Published
- 2010-05-25
- Volume
- 4
- Issue
- 6
- Pages
- 3422-3428
- ISSN
- 1936-0851 (ISSN-L)
- 1936-086X
- OpenAlex
- W2088415609
- Cited by
- 280
- References
- 1
- FWCI
- 11.27
- Type
- journal article
- Language
- en
- Open access
- closed
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