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Positioning single atoms with a scanning tunnelling microscope

Eigler, D. M., Schweizer, E. K.·1990·Nature

DOI 10.1038/344524a0

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Authors: Eigler, D. M., & Schweizer, E. K.
Affiliations: IBM Research - Almaden (US)
Fritz Haber Institute of the Max Planck Society (DE)
Venue: Nature
Publisher: Springer Science and Business Media LLC
Published: 1990-04
Volume: 344
Issue: 6266
Pages: 524-526
ISSN: 0028-0836 (ISSN-L)
1476-4687
DOI: 10.1038/344524a0
OpenAlex: W1965702561
Cited by: 3,161
References: 6
Citations by year: 2026: 44 · 2025: 69 · 2024: 61 · 2023: 72 · 2022: 55 · 2021: 73 · 2020: 52 · 2019: 81 · 2018: 96 · 2017: 96 · 2016: 81 · 2015: 97 · 2014: 71 · 2013: 97 · 2012: 93
FWCI: 49.91
Type: journal article
Language: en
Open access: closed
Licence: www.springer.com/tdm (tdm)
Locations: Nature (publishedVersion)
Topics: Physical Sciences › Physics and Astronomy › Condensed Matter Physics › Surface and Thin Film Phenomena
Physical Sciences › Chemistry › Physical and Theoretical Chemistry › Surface Chemistry and Catalysis
Physical Sciences › Physics and Astronomy › Atomic and Molecular Physics, and Optics › Force Microscopy Techniques and Applications
Keywords: scanning tunneling microscopy, xenon atoms, nickel surface, atomic-scale fabrication, low-temperature STM, device miniaturization, surface modification

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Positioning single atoms with a scanning tunnelling microscope

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