The DOI matches its Crossref record; 5 of the 5 references it cites were found in a registry or an index.
Optical frequency metrology
Overview
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Citations
Cites
Jones, D. J., Diddams, S. A., Ranka, J. K., Stentz, A., Windeler, R. S., Hall, J. L., & Cundiff, S. T. (2000) · Science · doi:10.1126/science.288.5466.635 · Cited by 2,661
Attosecond control of electronic processes by intense light fields
Baltuška, A., Udem, T., Uiberacker, M., Hentschel, M., Goulielmakis, E., Gohle, C., Holzwarth, R., Yakovlev, V. S., Scrinzi, A., Hänsch, T. W., et al. (2003) · Nature · doi:10.1038/nature01414 · Cited by 1,653
Self-citationDIRAC, P. A. M. (1937) · Nature · doi:10.1038/139323a0 · Cited by 1,495
Test of Relativistic Gravitation with a Space-Borne Hydrogen Maser
Vessot, R. F. C., Levine, M. W., Mattison, E. M., Blomberg, E. L., Hoffman, T. E., Nystrom, G. U., Farrel, B. F., Decher, R., Eby, P. B., Baugher, C. R., et al. (1980) · Physical Review Letters · doi:10.1103/physrevlett.45.2081 · Cited by 649
Niering, M., Holzwarth, R., Reichert, J., Pokasov, P., Udem, T., Weitz, M., Hänsch, T. W., Lemonde, P., Santarelli, G., Abgrall, M., et al. (2000) · Physical Review Letters · doi:10.1103/physrevlett.84.5496 · Cited by 560
Self-citation
Cited by
Krausz, F., & Ivanov, M. (2009) · Reviews of Modern Physics · doi:10.1103/revmodphys.81.163 · Cited by 5,468
Ludlow, A. D., Boyd, M. M., Ye, J., Peik, E., & Schmidt, P. O. (2015) · Reviews of Modern Physics · doi:10.1103/revmodphys.87.637 · Cited by 2,385
New CMOS-compatible platforms based on silicon nitride and Hydex for nonlinear optics
Moss, D. J., Morandotti, R., Gaeta, A. L., & Lipson, M. (2013) · Nature Photonics · doi:10.1038/nphoton.2013.183 · Cited by 1,792
Colloquium: Trapping and manipulating photon states in atomic ensembles
Lukin, M. D. (2003) · Reviews of Modern Physics · doi:10.1103/revmodphys.75.457 · Cited by 1,141
Nobel Lecture: Passion for precision
Hänsch, T. W. (2006) · Reviews of Modern Physics · doi:10.1103/revmodphys.78.1297 · Cited by 915
Self-citation
Metadata
- Authors
- Udem, T., Holzwarth, R., & Hänsch, T. W.
- Venue
- Nature
- Published
- 2002-03
- Volume
- 416
- Issue
- 6877
- Pages
- 233-237
- ISSN
- 0028-0836 (ISSN-L)
- 1476-4687
- OpenAlex
- W2056908124
- Cited by
- 3,111
- References
- 5
- FWCI
- 27.98
- Type
- journal article
- Language
- en
- Open access
- closed
About these checks
Registry, retraction, Cites and statistics results are computed, not judged, with one exception: a printed reference that no index lists is read once by a model before it counts as a citation error. Claims are extracted by a model and kept only when their quote appears verbatim in the text; each cited source is then checked, with a model’s help, for whether it says what the claim relies on. Those verdicts can be wrong — read the claim’s quote and the cited source before relying on one.
Statistics and arithmetic are recomputed, not judged.
Confidence bands are shown only for fields calibrated on our annotated test set. None is calibrated yet, so no band is shown.
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How to cite
Cite CoChat for the checks on this page, and the paper for its own findings.
- This page
- CoChat. (2026). Citation check: Optical frequency metrology. https://app.cochat.ai/papers/10.1038/416233a
- The paper
- Udem, T., Holzwarth, R., & Hänsch, T. W. (2002). Optical frequency metrology. Nature. https://doi.org/10.1038/416233a
Data sources
Bibliographic data: Semantic Scholar, OpenAlex, Crossref.
Contains information from the Semantic Scholar Academic Graph Datasets, made available under the ODC Attribution License (ODC-BY 1.0).
Semantic Scholar’s data is described in: Kinney, R., et al. (2023). The Semantic Scholar Open Data Platform. arXiv:2301.10140.