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Cited by 180Mechanical and Optical ResonatorsForce Microscopy Techniques and ApplicationsAcoustic Wave Resonator Technologies

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Ultrasensitive detection of force and displacement using trapped ions

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Biercuk, Michael J., Uys, Hermann, Britton, Joe W., VanDevender, Aaron P., Bollinger, John J.·2010·Nature Nanotechnology
DOI 10.1038/nnano.2010.165
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Abstract

The ability to detect extremely small forces and nanoscale displacements is vital for disciplines such as precision spin-resonance imaging, microscopy, and tests of fundamental physical phenomena. Current force-detection sensitivity limits have surpassed 1 aN Hz(-1/2) (refs 6,7) through coupling of nanomechanical resonators to a variety of physical readout systems. Here, we demonstrate that crystals of trapped atomic ions behave as nanoscale mechanical oscillators and may form the core of exquisitely sensitive force and displacement detectors. We report the detection of forces with a sensitivity of 390 +/- 150 yN Hz(-1/2), which is more than three orders of magnitude better than existing reports using nanofabricated devices(7), and discriminate ion displacements of approximately 18 nm. Our technique is based on the excitation of tunable normal motional modes in an ion trap and detection through phase-coherent Doppler velocimetry, and should ultimately allow force detection with a sensitivity better than 1 yN Hz(-1/2) (ref. 16). Trapped-ion-based sensors could enable scientists to explore new regimes in materials science where augmented force, field and displacement sensitivity may be traded against reduced spatial resolution.

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  • Work in collaboration with NIST has seen seminal advances in ion-trapping as a quantum simulator and for precise measurements.

    “Work in collaboration with the National Institute for Standards and Technology (NIST) has seen seminal advances in ion-trapping 45,46 as a quantum simulator and for precise measurements.”

    From Toward a quantum future for South Africa (2021) · cites this paper as [46]

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Metadata

Authors
Biercuk, M. J., Uys, H., Britton, J. W., VanDevender, A. P., & Bollinger, J. J.
Affiliations
  • The University of Sydney (AU)
  • National Institute of Standards and Technology (US)
Corresponding author
  • Biercuk, Michael J.
  • Bollinger, John J.
ORCID
Venue
Nature Nanotechnology
Publisher
Springer Science and Business Media LLC
Published
2010-08-22
Volume
5
Issue
9
Pages
646-650
ISSN
  • 1748-3387 (ISSN-L)
  • 1748-3395
DOI
10.1038/nnano.2010.165
OpenAlex
W2074316406
Cited by
180
References
1
Citations by year
2026: 9 · 2025: 15 · 2024: 19 · 2023: 11 · 2022: 13 · 2021: 18 · 2020: 11 · 2019: 7 · 2018: 8 · 2017: 14 · 2016: 10 · 2015: 8 · 2014: 9 · 2013: 9 · 2012: 5
FWCI
4.80
Type
journal article
Language
en
Open access
Licence
www.springer.com/tdm (tdm)
Locations
  • Nature Nanotechnology (publishedVersion)
  • PubMed (publishedVersion)
  • arXiv (Cornell University) (submittedVersion)
  • arXiv (Cornell University)
Topics
  • Physical Sciences › Physics and Astronomy › Atomic and Molecular Physics, and Optics › Mechanical and Optical Resonators
  • Physical Sciences › Physics and Astronomy › Atomic and Molecular Physics, and Optics › Force Microscopy Techniques and Applications
  • Physical Sciences › Engineering › Electrical and Electronic Engineering › Acoustic Wave Resonator Technologies
Keywords
trapped ions, force sensing, ionic crystals, nanomechanical resonators, Doppler velocimetry, force sensitivity

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