The DOI matches its Crossref record; 2 of the 2 references it cites were found in a registry or an index.
Graphene and two-dimensional materials for silicon technology
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Citations
Cites
Mounet, N., Gibertini, M., Schwaller, P., Campi, D., Merkys, A., Marrazzo, A., Sohier, T., Castelli, I. E., Cepellotti, A., Pizzi, G., et al. (2018) · Nature Nanotechnology · doi:10.1038/s41565-017-0035-5 · Cited by 1,863
Stacked nanosheet gate-all-around transistor to enable scaling beyond FinFET
Loubet, N., Hook, T., Montanini, P., Yeung, C.-W., Kanakasabapathy, S., Guillom, M., Yamashita, T., Zhang, J., Miao, X., Wang, J., et al. (2017) · 2017 Symposium on VLSI Technology · doi:10.23919/vlsit.2017.7998183 · Cited by 1,122
Cited by
Silicon/2D-material photodetectors: from near-infrared to mid-infrared
Liu, C., Guo, J., Yu, L., Li, J., Zhang, M., Li, H., Shi, Y., & Dai, D. (2021) · Light: Science & Applications · doi:10.1038/s41377-021-00551-4 · Cited by 473
Wu, D., Guo, C., Zeng, L., Ren, X., Shi, Z., Wen, L., Chen, Q., Zhang, M., Li, X. J., Shan, C.-X., et al. (2023) · Light: Science & Applications · doi:10.1038/s41377-022-01047-5 · Cited by 404
Metamaterial graphene photodetector with bandwidth exceeding 500 gigahertz
Koepfli, S. M., Baumann, M., Koyaz, Y., Gadola, R., Güngör, A., Keller, K., Horst, Y., Nashashibi, S., Schwanninger, R., Doderer, M., et al. (2023) · Science · doi:10.1126/science.adg8017 · Cited by 227
Ning, H., Yu, Z., Zhang, Q., Wen, H., Gao, B., Mao, Y., Li, Y., Zhou, Y., Zhou, Y., Chen, J., et al. (2023) · Nature Nanotechnology · doi:10.1038/s41565-023-01343-0 · Cited by 198
On-chip optoelectronic logic gates operating in the telecom band
He, T., Ma, H., Wang, Z., Li, Q., Liu, S., Duan, S., Xu, T., Wang, J., Wu, H., Zhong, F., et al. (2024) · Nature Photonics · doi:10.1038/s41566-023-01309-7 · Cited by 190
Self-citation
Metadata
- Authors
- Akinwande, D., Huyghebaert, C., Wang, C.-H., Serna, M. I., Goossens, S., Li, L.-J., Wong, H.-S. P., & Koppens, F. H. L.
- Venue
- Nature
- Published
- 2019-09-25
- Volume
- 573
- Issue
- 7775
- Pages
- 507-518
- ISSN
- 0028-0836 (ISSN-L)
- 1476-4687
- OpenAlex
- W2975458838
- Cited by
- 1,713
- References
- 2
- FWCI
- 54.62
- Type
- journal article
- Language
- en
- Open access
- closed
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Registry, retraction, Cites and statistics results are computed, not judged, with one exception: a printed reference that no index lists is read once by a model before it counts as a citation error. Claims are extracted by a model and kept only when their quote appears verbatim in the text; each cited source is then checked, with a model’s help, for whether it says what the claim relies on. Those verdicts can be wrong — read the claim’s quote and the cited source before relying on one.
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How to cite
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- CoChat. (2026). Citation check: Graphene and two-dimensional materials for silicon technology. https://app.cochat.ai/papers/10.1038/s41586-019-1573-9
- The paper
- Akinwande, D., Huyghebaert, C., Wang, C.-H., Serna, M. I., Goossens, S., Li, L.-J., Wong, H.-S. P., & Koppens, F. H. L. (2019). Graphene and two-dimensional materials for silicon technology. Nature. https://doi.org/10.1038/s41586-019-1573-9
Data sources
Bibliographic data: Semantic Scholar, OpenAlex, Crossref.
Contains information from the Semantic Scholar Academic Graph Datasets, made available under the ODC Attribution License (ODC-BY 1.0).
Semantic Scholar’s data is described in: Kinney, R., et al. (2023). The Semantic Scholar Open Data Platform. arXiv:2301.10140.
