Toward surface defect detection in electronics manufacturing by an accurate and lightweight YOLO-style object detector

Abstract

In electronics manufacturing, surface defect detection is very important for product quality control, and defective products can cause severe customer complaints. At the same time, in the manufacturing process, the cycle time of each product is usually very short. Furthermore, high-resolution input images from high-resolution industrial cameras are necessary to meet the requirements for high quality control standards. Hence, how to design an accurate object detector with real-time inference speed that can accept high-resolution input is an important task. In this work, an accurate YOLO-style object detector was designed, ATT-YOLO, which uses only one self-attention module, many-scale feature extraction and integration in the backbone and feature pyramid, and an improved auto-anchor design to address this problem. There are few datasets for surface detection in electronics manufacturing. Hence, we curated a dataset consisting of 14,478 laptop surface defects, on which ATT-YOLO achieved 92.8% mAP0.5 for the binary-class object detection task. We also further verified our design on the COCO benchmark dataset. Considering both computation costs and the performance of object detectors, ATT-YOLO outperforms several state-of-the-art and lightweight object detectors on the COCO dataset. It achieves a 44.9% mAP score and 21.8 GFLOPs, which is better than the compared models including YOLOv8-small (44.9%, 28.6G), YOLOv7-tiny-SiLU (38.7%, 13.8G), YOLOv6-small (43.1%, 44.2G), pp-YOLOE-small (42.7%, 17.4G), YOLOX-small (39.6%, 26.8G), and YOLOv5-small (36.7%, 17.2G). We hope that this work can serve as a useful reference for the utilization of attention-based networks in real-world situations.