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Identification of preferentially exposed crystal facets by X-ray diffraction
Open accessAbstract
Crystals with exposed facets are popular materials in many catalytic applications due to their high reactivity. Facet identification is often conducted by transmission electron microscopy (TEM). In this work, we analyze the effects of doping, vacancy creation, anisotropic broadening, and preferred orientation on the intensity of X-ray diffraction (XRD) peaks by using tetragonal bismuth oxyhalides (BiOX, X = Cl, Br, and I) as examples. The differences in these effects were successfully used to identify the preferentially exposed (001) facets of BiOX nanoplates synthesized by a polymer-assisted precipitation method. In comparison to TEM, the XRD analysis is not only cheaper and easier to perform, but also it gives results representative for the sample. This work aims to provide further justification for the use of XRD as a powerful and handy characterization technique in the field of crystal facet engineering.
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For aminated samples, the peak at 11-13° showed relative intensity higher than raw char, due to largely exposed facets of the crystal lattice.
“Interestingly, the peak at 11-13 ◦ for aminated samples ( Figure 8B ) showed relative intensity higher than the raw char. This is due to largely exposed facets of the crystal lattice that show a few peaks with high relative intensity (Zhang et al., 2020).”
From Effect of Pyrolysis Temperature on PhysicoChemical Properties and Acoustic-Based Amination of Biochar for Efficient CO2 Adsorption (2020) · cites this paper as Zhang et al., 2020
The Introduction says crystals with largely exposed facets often show a few XRD peaks with unusually high relative intensity. It also warns that peak intensity has other possible causes and that preferentially exposed facets must be evaluated before they are identified. The source therefore supports the proposed explanation in general, but not the definite attribution of the aminated samples’ 11–13° peak to exposed facets. (LLM, conf=0.86)
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Chatterjee, R., Sajjadi, B., Chen, W.-Y., Mattern, D. L., Hammer, N., Raman, V., & Dorris, A. (2020) · Frontiers in Energy Research · doi:10.3389/fenrg.2020.00085 · Cited by 385
Metadata
- Authors
- Zhang, L., Gonçalves, A. A. S., & Jaroniec, M.
- Affiliations
- Kent State University (US)
- Corresponding author
- Jaroniec, Mietek
- Venue
- RSC Advances
- Publisher
- Royal Society of Chemistry (RSC)
- Published
- 2020
- Volume
- 10
- Issue
- 10
- Pages
- 5585-5589
- ISSN
- 2046-2069 (ISSN-L)
- PMC
- PMC9049502
- OpenAlex
- W3005430821
- Cited by
- 94
- References
- 20
- Citations by year
- 2026: 23 · 2025: 19 · 2024: 16 · 2023: 6 · 2022: 9 · 2021: 10 · 2020: 11
- FWCI
- 3.50
- Type
- journal article
- Language
- en
- Open access
- gold
- doi.org
- Licence
- Locations
- RSC Advances (publishedVersion, cc-by-nc)
- PubMed Central (publishedVersion, cc-by-nc)
- PubMed (publishedVersion)
- Funders
- Kent State University
- Topics
- Physical Sciences › Materials Science › Materials Chemistry › X-ray Diffraction in Crystallography
- Physical Sciences › Materials Science › Surfaces, Coatings and Films › Electron and X-Ray Spectroscopy Techniques
- Physical Sciences › Energy › Renewable Energy, Sustainability and the Environment › Advanced Photocatalysis Techniques
- Keywords
- X-ray diffraction peak broadening, dopant effects, vacancy formation, crystallographic texture, facet engineering, (001) facets
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