Cited by 34Image Retrieval and Classification TechniquesIndustrial Vision Systems and Defect DetectionImage Processing and 3D Reconstruction

Shape-based retrieval of industrial surface defects using angular radius Fourier descriptor

Kunttu, I., Lepistö, L.·2007·IET Image Processing

Abstract

Current industrial surface inspection systems are capable of detecting various defects and producing images of them. The defect images are collected into large image databases. Effective retrieval methods are necessary to analyse the defects stored in the database. In this work, a novel shape descriptor for surface defect image retrieval is presented. The descriptor is based on the Fourier transform of the defect boundary. The proposed method, angular radius Fourier descriptor, combines the boundary function with the directional angle of the boundary line. The proposed method outperforms ordinary Fourier descriptors in the retrieval of paper defect shapes without increasing computational cost.

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Crossref · 10.1049/iet-ipr:20060113

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Authors
Kunttu, I., & Lepistö, L.
Affiliations
  • Tampere University of Technology (FI)
  • Institute of Signal Processing, Tampere University of Technology, P.O. Box 553, Tampere, FI-33101, Finland
Venue
IET Image Processing
Published
2007-06-05
Volume
1
Issue
2
Pages
231-236
ISSN
  • 1751-9659 (ISSN-L)
  • 1751-9667
OpenAlex
W2035919971
Cited by
34
References
26
Citations by year
2024: 1 · 2023: 1 · 2022: 1 · 2020: 1 · 2018: 1 · 2017: 1 · 2016: 3 · 2014: 1 · 2013: 3 · 2012: 5
FWCI
5.68
Type
journal article
Language
en
Open access
closed
Locations
IET Image Processing (publishedVersion)
Topics
  • Physical Sciences › Computer Science › Computer Vision and Pattern Recognition › Image Retrieval and Classification Techniques
  • Physical Sciences › Engineering › Industrial and Manufacturing Engineering › Industrial Vision Systems and Defect Detection
  • Physical Sciences › Computer Science › Computer Vision and Pattern Recognition › Image Processing and 3D Reconstruction
Keywords
shape retrieval, Fourier descriptors, paper defects, shape features, image retrieval

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