The DOI matches its Crossref record.
Review of series and parallel connection of IGBTs
Abstract
The availability of high power handling devices is of a great importance in the present power electronics industry. These high power ratings can be achieve by connecting existing devices in series or parallel depending on the application. The main problems associated with series and parallel connections are unequal sharing of voltage and current respectively. The active gate control techniques, snubber circuits and clamping circuits are some of the most common methods used to minimise the problem of unequal sharing of voltage and current. The aim of the paper is to review the available techniques to minimise the problems in series and parallel connections of insulated gate bipolar transistors.
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“The derating method is a means of maintaining the thermal stability and SOA operation of the parallel-connected chips/modules by reducing the rated operating limit of the chips/modules; this method is not capable of providing current balancing or improving current imbalance.”
From Paralleling of IGBT Power Semiconductor Devices and Reliability Issues (2023) · cites this paper as [38]
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Cites
No references could be resolved yet.
Research works printed but not linked: 22
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- Chen, 1996, Proc. IEEE IECON 22nd Int. Conf., 2, 999
- Consoli, 1995, Conference Record of the Industry Applications Conf., 3, 2752
- Gerster, 1994, Conf. Proc. Applied Power Electronics Conf., 1, 469
- 10.1109/41.925575 · DOI
- 10.1109/63.602558 · DOI
- Palmer, 1996, Sixth Int. Conf. on Power Electronics and Variable Speed Drives, 236, 10.1049/cp:19960919 · DOI
- Hong, 1999, Proc. IEEE Int. Conf. on Power Electronics and Drive Systems, 2, 646, 10.1109/PEDS.1999.792747 · DOI
- 10.1109/28.968198 · DOI
- Katoh, 2002, IEEE 33rd Power Electronics Specialist Conf., 2, 609
- Bruckmann, 1998, Industry Applications Conf., 2, 1067
- Sasagawa, 2002, Conf. Record of the Industry Applications Conf., 4, 2597
- Saiz, Oct.2001, Conf. Record of the Industry Applications Conf. 2001, 2, 1046
- Piazzesi, 2004, IEEE 35th Annual Power Electronics Specialists Conf., 2004, 2, 893, 10.1109/PESC.2004.1355537 · DOI
- Busatto, 1998, Industry Applications Conf., 2, 825
- Nakatake, 2003, IEEE 34th Annual Power Electronics Specialist Conf., 4, 1910
- Chamund, 2002, Int. Universities Power Engineering Conf. (UPEC), 262
- 10.1109/28.126748 · DOI
- Hofer, 1996, Annual IEEE Power Electronics Specialist Conf., 2, 1312, 10.1109/PESC.1996.548751 · DOI · Paper page
- Benda, V., Gower, J., and Grant, D.A.: ‘Power semiconductor devices, theory and applications’, (John Wiley and Sons 1999)
- Belverde, 1998, IEEE Industry Applications Conf., 2, 817
- 10.1049/ip-cds:19982123 · DOI
Cited by
Paralleling of IGBT Power Semiconductor Devices and Reliability Issues
Tripathi, R. N., & Omura, I. (2023) · Electronics · doi:10.3390/electronics12183826 · Cited by 14
Metadata
- Authors
- Shammas, N. Y. A., Withanage, R., & Chamund, D.
- Venue
- IEE Proceedings - Circuits, Devices and Systems
- Published
- 2006
- Volume
- 153
- Issue
- 1
- Pages
- 34
- ISSN
- 1350-2409
- Cited by
- 94
- References
- 0
- Language
- en
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Contains information from the Semantic Scholar Academic Graph Datasets, made available under the ODC Attribution License (ODC-BY 1.0).
Semantic Scholar’s data is described in: Kinney, R., et al. (2023). The Semantic Scholar Open Data Platform. arXiv:2301.10140.