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Kelvin probe force microscopy
Abstract
Measurements of the contact potential difference between different materials have been performed for the first time using scanning force microscopy. The instrument has a high resolution for both the contact potential difference (better than 0.1 mV) and the lateral dimension (<50 nm) and allows the simultaneous imaging of topography and contact potential difference. Images of gold, platinum, and palladium surfaces, taken in air, show a large contrast in the contact potential difference and demonstrate the basic concept.
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Citations
Cited by
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Kronik, L. (1999) · Surface Science Reports · doi:10.1016/s0167-5729(99)00002-3 · Cited by 1,648
Chiral molecules and the electron spin
Naaman, R., Paltiel, Y., & Waldeck, D. H. (2019) · Nature Reviews Chemistry · doi:10.1038/s41570-019-0087-1 · Cited by 934
Long range interactions in nanoscale science
French, R. H., Parsegian, V. A., Podgornik, R., Rajter, R. F., Jagota, A., Luo, J., Asthagiri, D., Chaudhury, M. K., Chiang, Y.-M., Granick, S., et al. (2010) · Reviews of Modern Physics · doi:10.1103/revmodphys.82.1887 · Cited by 441
Solid Layer Thermal-Conductivity Measurement Techniques
Goodson, K. E., & Flik, M. I. (1994) · Applied Mechanics Reviews · doi:10.1115/1.3111073 · Cited by 75
Kinsella, J. M., & Ivanisevic, A. (2007) · Nature Nanotechnology · doi:10.1038/nnano.2007.313 · Cited by 65
Metadata
- Authors
- Nonnenmacher, M., O’Boyle, M. P., & Wickramasinghe, H. K.
- Venue
- Applied Physics Letters
- Publisher
- AIP Publishing
- Published
- 1991-06-24
- Volume
- 58
- Issue
- 25
- Pages
- 2921-2923
- ISSN
- 0003-6951 (ISSN-L)
- 1077-3118
- OpenAlex
- W1970138328
- Cited by
- 2,343
- References
- 0
- FWCI
- 6.63
- Type
- journal article
- Language
- en
- Open access
- closed
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- Nonnenmacher, M., O’Boyle, M. P., & Wickramasinghe, H. K. (1991). Kelvin probe force microscopy. Applied Physics Letters. https://doi.org/10.1063/1.105227
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