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Nanoscale patterning and oxidation of H-passivated Si(100)-2×1 surfaces with an ultrahigh vacuum scanning tunneling microscope

Lyding, J. W., Shen, T.-C., Hubacek, J. S., Tucker, J. R., Abeln, G. C.·1994·Applied Physics Letters

Abstract

Nanoscale patterning of the hydrogen terminated Si(100)-2×1 surface has been achieved with an ultrahigh vacuum scanning tunneling microscope. Patterning occurs when electrons field emitted from the probe locally desorb hydrogen, converting the surface into clean silicon. Linewidths of 1 nm on a 3 nm pitch are achieved by this technique. Local chemistry is also demonstrated by the selective oxidation of the patterned areas. During oxidation, the linewidth is preserved and the surrounding H-passivated regions remain unaffected, indicating the potential use of this technique in multistep lithography processes.

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Metadata

Authors
Lyding, J. W., Shen, T.-C., Hubacek, J. S., Tucker, J. R., & Abeln, G. C.
Venue
Applied Physics Letters
Published
1994-04-11
Volume
64
Issue
15
Pages
2010-2012
ISSN
  • 0003-6951 (ISSN-L)
  • 1077-3118
OpenAlex
W2033013230
Cited by
489
References
0
FWCI
26.95
Type
journal article
Language
en
Open access
closed

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CoChat. (2026). Citation check: Nanoscale patterning and oxidation of H-passivated Si(100)-2×1 surfaces with an ultrahigh vacuum scanning tunneling microscope. https://app.cochat.ai/papers/10.1063/1.111722
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Lyding, J. W., Shen, T.-C., Hubacek, J. S., Tucker, J. R., & Abeln, G. C. (1994). Nanoscale patterning and oxidation of H-passivated Si(100)-2×1 surfaces with an ultrahigh vacuum scanning tunneling microscope. Applied Physics Letters. https://doi.org/10.1063/1.111722

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