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Piezoelectric tip-sample distance control for near field optical microscopes

Karrai, Khaled, Grober, Robert D.·1995·Applied Physics Letters

Abstract

An aluminum coated tapered optical fiber is rigidly attached to one of the prongs of a high Q piezoelectric tuning fork. The fork is mechanically dithered at its resonance frequency (33 kHz) so that the tip amplitude does not exceed 0.4 nm. A corresponding piezoelectric signal is measured on electrodes appropriately placed on the prongs. As the tip approaches within 20 nm above the sample surface a 0.1 nN drag force acting on the tip causes the signal to reduce. This signal is used to position the optical fiber tip to about 0 to 25 nm above the sample. Shear forces resulting from the tip-sample interaction can be quantitatively deduced.

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Metadata

Authors
Karrai, K., & Grober, R. D.
Venue
Applied Physics Letters
Published
1995-04-03
Volume
66
Issue
14
Pages
1842-1844
ISSN
  • 0003-6951 (ISSN-L)
  • 1077-3118
OpenAlex
W2069910691
Cited by
968
References
0
FWCI
30.04
Type
journal article
Language
en
Open access
closed

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CoChat. (2026). Citation check: Piezoelectric tip-sample distance control for near field optical microscopes. https://app.cochat.ai/papers/10.1063/1.113340
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Karrai, K., & Grober, R. D. (1995). Piezoelectric tip-sample distance control for near field optical microscopes. Applied Physics Letters. https://doi.org/10.1063/1.113340

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