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Work function of indium tin oxide transparent conductor measured by photoelectron spectroscopy
Abstract
We used ultraviolet and x-ray photoelectron spectroscopy (XPS) and (UPS) techniques to directly measure absolute values of vacuum work function of indium tin oxide (ITO) thin films. We obtained a work function of 4.4–4.5 eV which is lower than the commonly cited value. These values do not change substantially by heating and Ar ion sputtering. The atomic concentrations of each element in ITO, measured with XPS, are also quite stable under heat treatment and ion sputtering.
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Citations
Cited by
Clavero, C. (2014) · Nature Photonics · doi:10.1038/nphoton.2013.238 · Cited by 2,762
Transparent Conducting Oxides—An Up-To-Date Overview
Stadler, A. (2012) · Materials · doi:10.3390/ma5040661 · Cited by 448
Fast and Sensitive Colloidal Quantum Dot Mid-Wave Infrared Photodetectors
Ackerman, M. M., Tang, X., & Guyot-Sionnest, P. (2018) · ACS Nano · doi:10.1021/acsnano.8b03425 · Cited by 272
Metadata
- Authors
- Park, Y., Choong, V., Gao, Y., Hsieh, B. R., & Tang, C. W.
- Venue
- Applied Physics Letters
- Publisher
- AIP Publishing
- Published
- 1996-05-06
- Volume
- 68
- Issue
- 19
- Pages
- 2699-2701
- ISSN
- 0003-6951 (ISSN-L)
- 1077-3118
- OpenAlex
- W2015357699
- Cited by
- 690
- References
- 0
- FWCI
- 6.32
- Type
- journal article
- Language
- en
- Open access
- closed
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- CoChat. (2026). Citation check: Work function of indium tin oxide transparent conductor measured by photoelectron spectroscopy. https://app.cochat.ai/papers/10.1063/1.116313
- The paper
- Park, Y., Choong, V., Gao, Y., Hsieh, B. R., & Tang, C. W. (1996). Work function of indium tin oxide transparent conductor measured by photoelectron spectroscopy. Applied Physics Letters. https://doi.org/10.1063/1.116313
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