The DOI matches its Crossref record.
Refractive Index of ZnSe, ZnTe, and CdTe
Abstract
Refractive indexes of ZnSe, ZnTe, and CdTe were obtained from prism refraction data and are reported for a series of wavelengths from 2.5 μ to the short-wave transmission limits set by the band gaps. The results were fitted with the standard formula: n2=A +[Bλ2/(λ2−c2)] where n is the refractive index and λ is the wavelength in microns. For ZnSe the best values of the parameters are A=4.00, B=1.90, and c2=0.113; for ZnTe, A=4.27, B=3.01, and c2=0.142; and for CdTe, A=5.68, B=1.53, and c2=0.366. Possible causes for the discrepancies between the present results and earlier data are discussed.
Overview
The claims and statistics of this paper haven’t been checked yet.
Run the check — free, no account needed. It reads the open-access text and checks the sources it cites.
Integrity signals
Registry
Cites
Statistics
Verification
Claims the paper makes
The claims and statistics of this paper haven’t been checked yet.
Run the check — free, no account needed. It reads the open-access text and checks the sources it cites.
Self-check
Percentages, sums and reported differences re-computed from the paper’s own numbers.
The self-check needs the paper’s full text.
Citations
Cited by
Self‐Assembled Photonic Structures
Galisteo‐López, J. F., Ibisate, M., Sapienza, R., Froufe‐Pérez, L. S., Blanco, Á., & López, C. (2011) · Advanced Materials · doi:10.1002/adma.201000356 · Cited by 668
Detectors and sources for ultrabroadband electro-optic sampling: Experiment and theory
Leitenstorfer, A., Hunsche, S., Shah, J., Nuss, M. C., & Knox, W. H. (1999) · Applied Physics Letters · doi:10.1063/1.123601 · Cited by 461
(INVITED)Planar Microcavities: Materials and Processing for Light Control
Megahd, H., Comoretto, D., & Lova, P. (2022) · Optical Materials: X · doi:10.1016/j.omx.2021.100130 · Cited by 19
Metadata
- Authors
- Marple, D. T. F.
- Venue
- Journal of Applied Physics
- Publisher
- AIP Publishing
- Published
- 1964-03-01
- Volume
- 35
- Issue
- 3
- Pages
- 539-542
- ISSN
- 0021-8979 (ISSN-L)
- 1089-7550
- OpenAlex
- W1982069759
- Cited by
- 505
- References
- 0
- FWCI
- 11.71
- Type
- journal article
- Language
- en
- Open access
- closed
About these checks
Registry, retraction, Cites and statistics results are computed, not judged, with one exception: a printed reference that no index lists is read once by a model before it counts as a citation error. Claims are extracted by a model and kept only when their quote appears verbatim in the text; each cited source is then checked, with a model’s help, for whether it says what the claim relies on. Those verdicts can be wrong — read the claim’s quote and the cited source before relying on one.
Statistics and arithmetic are recomputed, not judged.
Confidence bands are shown only for fields calibrated on our annotated test set. None is calibrated yet, so no band is shown.
What counts as a claim ›How we measure confidence ›How we check this ›
Are you an author, or do you see a problem with this page? Request a review
How to cite
Cite CoChat for the checks on this page, and the paper for its own findings.
- This page
- CoChat. (2026). Citation check: Refractive Index of ZnSe, ZnTe, and CdTe. https://app.cochat.ai/papers/10.1063/1.1713411
- The paper
- Marple, D. T. F. (1964). Refractive Index of ZnSe, ZnTe, and CdTe. Journal of Applied Physics. https://doi.org/10.1063/1.1713411
Data sources
Bibliographic data: Semantic Scholar, OpenAlex, Crossref.
Contains information from the Semantic Scholar Academic Graph Datasets, made available under the ODC Attribution License (ODC-BY 1.0).
Semantic Scholar’s data is described in: Kinney, R., et al. (2023). The Semantic Scholar Open Data Platform. arXiv:2301.10140.