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Ferroelectric thin films: Review of materials, properties, and applications
Open accessAbstract
An overview of the state of art in ferroelectric thin films is presented. First, we review applications: microsystems’ applications, applications in high frequency electronics, and memories based on ferroelectric materials. The second section deals with materials, structure (domains, in particular), and size effects. Properties of thin films that are important for applications are then addressed: polarization reversal and properties related to the reliability of ferroelectric memories, piezoelectric nonlinearity of ferroelectric films which is relevant to microsystems’ applications, and permittivity and loss in ferroelectric films—important in all applications and essential in high frequency devices. In the context of properties we also discuss nanoscale probing of ferroelectrics. Finally, we comment on two important emerging topics: multiferroic materials and ferroelectric one-dimensional nanostructures.
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Damjanovic, D., & Demartin, M. (1997) · Journal of Physics Condensed Matter · doi:10.1088/0953-8984/9/23/018 · Cited by 343
Cited by
Lee, M.-J., Lee, C. B., Lee, D., Lee, S. R., Chang, M., Hur, J. H., Kim, Y.-B., Kim, C.-J., Seo, D. H., Seo, S., et al. (2011) · Nature Materials · doi:10.1038/nmat3070 · Cited by 2,228
Microscale acoustofluidics: Microfluidics driven via acoustics and ultrasonics
Friend, J., & Yeo, L. Y. (2011) · Reviews of Modern Physics · doi:10.1103/revmodphys.83.647 · Cited by 964
Multibit memory operation of metal-oxide bi-layer memristors
Stathopoulos, S., Khiat, A., Trapatseli, M., Cortese, S., Serb, A., Valov, I., & Prodromakis, T. (2017) · Scientific Reports · doi:10.1038/s41598-017-17785-1 · Cited by 312
Recent Progress on BaTiO3-Based Piezoelectric Ceramics for Actuator Applications
Gao, J., Xue, D., Liu, W., Zhou, C., & Ren, X. (2017) · Actuators · doi:10.3390/act6030024 · Cited by 310
Colloquium: Emergent properties in plane view: Strong correlations at oxide interfaces
Chakhalian, J., Freeland, J. W., Millis, A. J., Panagopoulos, C., & Rondinelli, J. M. (2014) · Reviews of Modern Physics · doi:10.1103/revmodphys.86.1189 · Cited by 272
Metadata
- Authors
- Setter, N., Damjanovic, D., Eng, L., Fox, G., Gevorgian, S., Hong, S., Kingon, A., Kohlstedt, H., Park, N. Y., Stephenson, G. B., Stolitchnov, I., Taganstev, A. K., Taylor, D. V., Yamada, T., & Streiffer, S.
- Venue
- Journal of Applied Physics
- Publisher
- AIP Publishing
- Published
- 2006-09-01
- Volume
- 100
- Issue
- 5
- ISSN
- 0021-8979 (ISSN-L)
- 1089-7550
- OpenAlex
- W2015445221
- Cited by
- 1,907
- References
- 1
- FWCI
- 32.77
- Type
- journal article
- Language
- en
- Open access
- green
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- Setter, N., Damjanovic, D., Eng, L., Fox, G., Gevorgian, S., Hong, S., Kingon, A., Kohlstedt, H., Park, N. Y., Stephenson, G. B., Stolitchnov, I., Taganstev, A. K., Taylor, D. V., Yamada, T., & Streiffer, S. (2006). Ferroelectric thin films: Review of materials, properties, and applications. Journal of Applied Physics. https://doi.org/10.1063/1.2336999
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