The DOI matches its Crossref record; 2 of the 2 references it cites were found in a registry or an index.
Variable temperature Raman microscopy as a nanometrology tool for graphene layers and graphene-based devices
Abstract
Raman microscopy of graphene was carried out over the temperature range from 83to373K. The number of layers was independently confirmed by the quantum Hall measurements and atomic force microscopy. The values of the temperature coefficients for the G and 2D-band frequencies extracted from Raman spectra of the single-layer graphene are −(1.6±0.2)×10−2cm−1∕K and −(3.4±0.4)×10−2cm−1∕K, respectively. The G peak temperature coefficients of the bilayer graphene and bulk graphite are −(1.5±0.06)×10−2cm−1∕K and −(1.1±0.04)×10−2cm−1∕K, respectively. The results are important for the application of Raman microscopy as a nanometrology tool for the graphene-based devices operating at various temperatures.
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Cites
Two-dimensional gas of massless Dirac fermions in graphene
Novoselov, K. S., Geim, A. K., Morozov, S. V., Jiang, D., Katsnelson, M. I., Grigorieva, I. V., Dubonos, S. V., & Firsov, A. A. (2005) · Nature · doi:10.1038/nature04233 · Cited by 21,611
Z 2 Topological Order and the Quantum Spin Hall Effect
Kane, C. L., & Mele, E. J. (2005) · Physical Review Letters · doi:10.1103/physrevlett.95.146802 · Cited by 6,460
Cited by
Superior Thermal Conductivity of Single-Layer Graphene
Balandin, A. A., Ghosh, S., Bao, W., Calizo, I., Teweldebrhan, D., Miao, F., & Lau, C. N. (2008) · Nano Letters · doi:10.1021/nl0731872 · Cited by 13,823
Self-citationGhosh, S., Calizo, I., Teweldebrhan, D., Pokatilov, E. P., Nika, D. L., Balandin, A. A., Bao, W., Miao, F., & Lau, C. N. (2008) · Applied Physics Letters · doi:10.1063/1.2907977 · Cited by 2,099
Self-citationRaman spectroscopy of graphene-based materials and its applications in related devices
Wu, J.-B., Lin, M.-L., Cong, X., Liu, H.-N., & Tan, P.-H. (2018) · Chemical Society Reviews · doi:10.1039/c6cs00915h · Cited by 2,092
Lattice thermal conductivity of graphene flakes: Comparison with bulk graphite
Nika, D. L., Ghosh, S., Pokatilov, E. P., & Balandin, A. A. (2009) · Applied Physics Letters · doi:10.1063/1.3136860 · Cited by 533
Self-citationModification of graphene properties due to electron-beam irradiation
Teweldebrhan, D., & Balandin, A. A. (2009) · Applied Physics Letters · doi:10.1063/1.3062851 · Cited by 434
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Metadata
- Authors
- Calizo, I., Miao, F., Bao, W., Lau, C. N., & Balandin, A. A.
- Venue
- Applied Physics Letters
- Publisher
- AIP Publishing
- Published
- 2007-08-13
- Volume
- 91
- Issue
- 7
- ISSN
- 0003-6951 (ISSN-L)
- 1077-3118
- OpenAlex
- W2001369917
- Cited by
- 194
- References
- 2
- FWCI
- 8.78
- Type
- journal article
- Language
- en
- Open access
- closed
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- Calizo, I., Miao, F., Bao, W., Lau, C. N., & Balandin, A. A. (2007). Variable temperature Raman microscopy as a nanometrology tool for graphene layers and graphene-based devices. Applied Physics Letters. https://doi.org/10.1063/1.2771379
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