Student or educator? Sign up with your school email and get 6 months of Pro free.
Cited by 712

The DOI matches its Crossref record.

Experimental High-Resolution Electron Microscopy

Spence, J. C. H., Crewe, Albert V.·1981·Physics Today

Abstract

The new edition of this practical microscopy guide includes additional material on high-resolution images of periodic structures and associated techniques. It provides both a view of the fundamental principles of electron microscopy and detailed practical information needed to record the images. Various theoretical results are summarized and practical examples given. A considerable fraction of the book has also been set aside for practical information on setting up and using an electron microscope. Applications in materials science, mineralogy, the biology of radiation-sensitive specimens, semiconductor physics and solid-state chemistry are all described for research workers in these fields.

Overview

The claims and statistics of this paper haven’t been checked yet.

Run the check — free, no account needed. It reads the open-access text and checks the sources it cites.

A few free checks a day · papers already verified open instantly · results are public

Integrity signals

Registry

Crossref · 10.1063/1.2914772

Cites

Statistics

Verification

Claims the paper makes

The claims and statistics of this paper haven’t been checked yet.

Run the check — free, no account needed. It reads the open-access text and checks the sources it cites.

A few free checks a day · papers already verified open instantly · results are public

Self-check

Percentages, sums and reported differences re-computed from the paper’s own numbers.

The self-check needs the paper’s full text.

Citations

Cited by

See all 712

Metadata

Authors
Spence, J. C. H., & Crewe, A. V.
Venue
Physics Today
Published
1981-09-01
Volume
34
Issue
9
Pages
90-90
ISSN
  • 0031-9228 (ISSN-L)
  • 1945-0699
OpenAlex
W2044634405
Cited by
712
References
0
FWCI
15.70
Type
journal article
Language
en
Open access
closed

About these checks

Registry, retraction, Cites and statistics results are computed, not judged, with one exception: a printed reference that no index lists is read once by a model before it counts as a citation error. Claims are extracted by a model and kept only when their quote appears verbatim in the text; each cited source is then checked, with a model’s help, for whether it says what the claim relies on. Those verdicts can be wrong — read the claim’s quote and the cited source before relying on one.

Statistics and arithmetic are recomputed, not judged.

Confidence bands are shown only for fields calibrated on our annotated test set. None is calibrated yet, so no band is shown.

What counts as a claim ›How we measure confidence ›How we check this ›

Are you an author, or do you see a problem with this page? Request a review

How to cite

Cite CoChat for the checks on this page, and the paper for its own findings.

This page
CoChat. (2026). Citation check: Experimental High-Resolution Electron Microscopy. https://app.cochat.ai/papers/10.1063/1.2914772
The paper
Spence, J. C. H., & Crewe, A. V. (1981). Experimental High-Resolution Electron Microscopy. Physics Today. https://doi.org/10.1063/1.2914772

Data sources

Bibliographic data: Semantic Scholar, OpenAlex, Crossref.

Contains information from the Semantic Scholar Academic Graph Datasets, made available under the ODC Attribution License (ODC-BY 1.0).

Semantic Scholar’s data is described in: Kinney, R., et al. (2023). The Semantic Scholar Open Data Platform. arXiv:2301.10140.