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Cited by 266

The DOI matches its Crossref record; 1 of the 1 references it cites were found in a registry or an index.

Conformal Al2O3 dielectric layer deposited by atomic layer deposition for graphene-based nanoelectronics

Lee, Bongki, Park, Seong-Yong, Kim, Hyun-Chul, Cho, KyeongJae, Vogel, Eric M., Kim, Moon J., Wallace, Robert M., Kim, Jiyoung·2008·Applied Physics Letters

Abstract

We present a facile route which combines the functionalization of a highly oriented pyrolytic graphite surface with an atomic layer deposition (ALD) process to allow for conformal Al2O3 layers. While the trimethylaluminum (TMA)∕H2O process caused selective deposition only along step edges, the TMA∕O3 process began to provide nucleation sites on the basal planes of the surface. O3 pretreatment, immediately followed by the ALD process with TMA∕O3 chemistry, formed Al2O3 layers without any preferential deposition at the step edges. This is attributed to functionalization of graphene by ozone treatment, imparting a hydrophilic character which is desirable for ALD deposition.

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Crossref · 10.1063/1.2928228

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Metadata

Authors
Lee, B., Park, S.-Y., Kim, H.-C., Cho, K., Vogel, E. M., Kim, M. J., Wallace, R. M., & Kim, J.
Venue
Applied Physics Letters
Published
2008-05-19
Volume
92
Issue
20
ISSN
  • 0003-6951 (ISSN-L)
  • 1077-3118
OpenAlex
W2038293987
Cited by
266
References
1
FWCI
18.83
Type
journal article
Language
en
Open access
closed

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CoChat. (2026). Citation check: Conformal Al2O3 dielectric layer deposited by atomic layer deposition for graphene-based nanoelectronics. https://app.cochat.ai/papers/10.1063/1.2928228
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Lee, B., Park, S.-Y., Kim, H.-C., Cho, K., Vogel, E. M., Kim, M. J., Wallace, R. M., & Kim, J. (2008). Conformal Al2O3 dielectric layer deposited by atomic layer deposition for graphene-based nanoelectronics. Applied Physics Letters. https://doi.org/10.1063/1.2928228

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