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Nanosecond switching in GeTe phase change memory cells

Bruns, G., Merkelbach, P., Schlockermann, C., Salinga, M., Wuttig, M., Happ, T. D., Philipp, J. B., Kund, M.·2009·Applied Physics Letters

Abstract

The electrical switching behavior of GeTe-based phase change memory devices is characterized by time resolved experiments. SET pulses with a duration of less than 16 ns are shown to crystallize the material. Depending on the resistance of the RESET state, the minimum SET pulse duration can even be reduced down to 1 ns. This finding is attributed to the increasing impact of crystal growth upon decreasing switchable volume. Using GeTe or materials with similar crystal growth velocities, hence promises nonvolatile phase change memories with dynamic random access memorylike switching speeds.

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Metadata

Authors
Bruns, G., Merkelbach, P., Schlockermann, C., Salinga, M., Wuttig, M., Happ, T. D., Philipp, J. B., & Kund, M.
Venue
Applied Physics Letters
Published
2009-07-27
Volume
95
Issue
4
ISSN
  • 0003-6951 (ISSN-L)
  • 1077-3118
OpenAlex
W2078067390
Cited by
463
References
0
FWCI
16.59
Type
journal article
Language
en
Open access
closed

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CoChat. (2026). Citation check: Nanosecond switching in GeTe phase change memory cells. https://app.cochat.ai/papers/10.1063/1.3191670
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Bruns, G., Merkelbach, P., Schlockermann, C., Salinga, M., Wuttig, M., Happ, T. D., Philipp, J. B., & Kund, M. (2009). Nanosecond switching in GeTe phase change memory cells. Applied Physics Letters. https://doi.org/10.1063/1.3191670

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Semantic Scholar’s data is described in: Kinney, R., et al. (2023). The Semantic Scholar Open Data Platform. arXiv:2301.10140.