The DOI matches its Crossref record; 30 of the 30 references it cites were found in a registry or an index.
Cathodoluminescence scanning electron microscopy of semiconductors
Abstract
This paper reviews applications of cathodoluminescence scanning electron microscopy in the assessment of optical and electronic properties of semiconductors. The assessment includes, for example, information on band structure and impurity levels derived from spectroscopic cathodoluminescence, analysis of dopant concentrations at a level which is in some cases several orders of magnitude better than x-ray microanalysis, and mapping of carrier lifetimes and defects. Recent advances in both the various cathodoluminescence techniques and the processes leading to electron-beam-induced luminescence in semiconductors are reviewed. Possible future trends are also discussed.
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Citations
Cites
Statistics of the Recombinations of Holes and Electrons
Shockley, W., & Read, W. T. (1952) · Physical Review · doi:10.1103/physrev.87.835 · Cited by 6,589
The Long-Wavelength Edge of Photographic Sensitivity and of the Electronic Absorption of Solids
Urbach, F. (1953) · Physical Review · doi:10.1103/physrev.92.1324 · Cited by 6,047
Temperature dependence of the energy gap in semiconductors
Varshni, Y. P. (1967) · Physica · doi:10.1016/0031-8914(67)90062-6 · Cited by 5,469
Scanning Electron Microscopy and X-Ray Microanalysis
Goldstein, J. I., Newbury, D. E., Michael, J. R., Ritchie, N. W. M., Scott, J. H. J., & Joy, D. C. (2018) · Springer eBooks · doi:10.1007/978-1-4939-6676-9 · Cited by 5,361
Optical Processes in Semiconductors
Pankove, J. I., & Kiewit, D. A. (1972) · Journal of The Electrochemical Society · doi:10.1149/1.2404256 · Cited by 4,616
Deep-level transient spectroscopy: A new method to characterize traps in semiconductors
Lang, D. V. (1974) · Journal of Applied Physics · doi:10.1063/1.1663719 · Cited by 3,735
Nabarro, F. R. N., Duesbery, M. S., Hirth, J. P., & Kubin, L. P. (1979) · Cited by 2,675
Physics and chemistry of II-VI compounds
Aven, M. H., & Prener, J. S. (1967) · Medical Entomology and Zoology · Cited by 1,594
Penetration and energy-loss theory of electrons in solid targets
Kanaya, K., & Okayama, S. (1972) · Journal of Physics D: Applied Physics · doi:10.1088/0022-3727/5/1/308 · Cited by 1,457
Concepts in photoconductivity and allied problems
(1964) · Journal of the Franklin Institute · doi:10.1016/0016-0032(64)90059-6 · Cited by 1,418
Cited by
Schnauber, P., Singh, A., Schall, J., Park, S. I., Song, J. D., Rodt, S., Srinivasan, K., Reitzenstein, S., & Davanco, M. (2019) · Nano Letters · doi:10.1021/acs.nanolett.9b02758 · Cited by 87
Metadata
- Authors
- Yacobi, B. G., & Holt, D. B.
- Venue
- Journal of Applied Physics
- Publisher
- AIP Publishing
- Published
- 1986-02-15
- Volume
- 59
- Issue
- 4
- Pages
- R1-R24
- ISSN
- 0021-8979 (ISSN-L)
- 1089-7550
- OpenAlex
- W2071349256
- Cited by
- 275
- References
- 30
- FWCI
- 5.30
- Type
- journal article
- Language
- en
- Open access
- closed
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- Yacobi, B. G., & Holt, D. B. (1986). Cathodoluminescence scanning electron microscopy of semiconductors. Journal of Applied Physics. https://doi.org/10.1063/1.336491
Data sources
Bibliographic data: Semantic Scholar, OpenAlex, Crossref.
Contains information from the Semantic Scholar Academic Graph Datasets, made available under the ODC Attribution License (ODC-BY 1.0).
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