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Laser interferometer for the study of piezoelectric and electrostrictive strains
Abstract
A modified Michelson interferometer is used to study the strain properties of piezoelectric and electrostrictive materials. For small displacement, a feedback loop is introduced to stabilize the system against the low-frequency optical path-length drifting and the system is capable of resolving displacements of the order of 10−3 Å. For the strain induced by domain switching, a dual-channel signal detection scheme is used which automatically reads out the displacement of the sample. The effect on the measurement of the sample bonding to a substrate and other related problems are discussed.
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Cited by
Processing, Structure, Properties, and Applications of PZT Thin Films
Izyumskaya, N., Alivov, Y.-I., Cho, S.-J., Morkoç, H., Lee, H., & Kang, Y.-S. (2007) · Critical Reviews in Solid State and Materials Sciences · doi:10.1080/10408430701707347 · Cited by 481
PZT thin films for microsensors and actuators: Where do we stand?
Muralt, P. (2000) · IEEE Transactions on Ultrasonics, Ferroelectrics and Frequency Control · doi:10.1109/58.852073 · Cited by 375
The extrinsic nature of nonlinear behavior observed in lead zirconate titanate ferroelectric ceramic
Li, S., Cao, W., & Cross, L. E. (1991) · Journal of Applied Physics · doi:10.1063/1.347616 · Cited by 342
Self-citationPolla, D. L., & Francis, L. F. (1998) · Annual Review of Materials Science · doi:10.1146/annurev.matsci.28.1.563 · Cited by 317
Zhang, Q. M., Pan, W. Y., Jang, S. J., & Cross, L. E. (1988) · Journal of Applied Physics · doi:10.1063/1.342059 · Cited by 241
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Metadata
- Authors
- Zhang, Q. M., Pan, W. Y., & Cross, L. E.
- Venue
- Journal of Applied Physics
- Publisher
- AIP Publishing
- Published
- 1988-04-15
- Volume
- 63
- Issue
- 8
- Pages
- 2492-2496
- ISSN
- 0021-8979 (ISSN-L)
- 1089-7550
- OpenAlex
- W1995657576
- Cited by
- 161
- References
- 0
- FWCI
- 5.19
- Type
- journal article
- Language
- en
- Open access
- closed
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