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Intrinsic dead layer effect and the performance of ferroelectric thin film capacitors
Abstract
We apply the Thomas theory of ferroelectricity to bulk and thin film perovskite ferroelectrics in the paraelectric regime above the transition temperature. From available data on bulk SrTiO3 we are able to fully determine the parameters in the Thomas theory for this material, with overall reasonable results, supporting its validity. In a new application of the Thomas theory to the surface of a thin ferroelectric film in the linear response regime, it is found that there is anticipated to be an intrinsic “dead layer effect” on the surface of a dielectric film which significantly reduces the effective dielectric constant observed in capacitor applications. Two predictions of the theory are verified from recent experimental data. An experiment is suggested to distinguish between linear and nonlinear surface effects.
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Cited by
Ferroelectric thin films: Review of materials, properties, and applications
Setter, N., Damjanovic, D., Eng, L., Fox, G., Gevorgian, S., Hong, S., Kingon, A., Kohlstedt, H., Park, N. Y., Stephenson, G. B., et al. (2006) · Journal of Applied Physics · doi:10.1063/1.2336999 · Cited by 1,907
Two‐Dimensional Dielectric Nanosheets: Novel Nanoelectronics From Nanocrystal Building Blocks
Osada, M., & Sasaki, T. (2012) · Advanced Materials · doi:10.1002/adma.201103241 · Cited by 1,119
Origin of the dielectric dead layer in nanoscale capacitors
Stengel, M., & Spaldin, N. A. (2006) · Nature · doi:10.1038/nature05148 · Cited by 586
Local polarization dynamics in ferroelectric materials
Kalinin, S. V., Morozovska, A. N., Chen, L. Q., & Rodriguez, B. J. (2010) · Reports on Progress in Physics · doi:10.1088/0034-4885/73/5/056502 · Cited by 419
Dielectric Response of Soft Modes in Ferroelectric Thin Films
Petzelt, J., Kužel, P., Rychetský, I., Pashkin, A., & Ostapchuk, T. (2003) · Ferroelectrics · doi:10.1080/00150190390211891 · Cited by 38
Metadata
- Authors
- Zhou, C., & Newns, D. M.
- Venue
- Journal of Applied Physics
- Publisher
- AIP Publishing
- Published
- 1997-09-15
- Volume
- 82
- Issue
- 6
- Pages
- 3081-3088
- ISSN
- 0021-8979 (ISSN-L)
- 1089-7550
- OpenAlex
- W2042015084
- Cited by
- 307
- References
- 0
- FWCI
- 11.44
- Type
- journal article
- Language
- en
- Open access
- closed
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- Zhou, C., & Newns, D. M. (1997). Intrinsic dead layer effect and the performance of ferroelectric thin film capacitors. Journal of Applied Physics. https://doi.org/10.1063/1.366147
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