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Gallium oxide (Ga2O3) metal-semiconductor field-effect transistors on single-crystal β-Ga2O3 (010) substrates

Higashiwaki, Masataka, Sasaki, Kohei, Kuramata, Akito, Masui, Takekazu, Yamakoshi, Shigenobu·2012·Applied Physics Letters

Abstract

We report a demonstration of single-crystal gallium oxide (Ga2O3) metal-semiconductor field-effect transistors (MESFETs). A Sn-doped Ga2O3 layer was grown on a semi-insulating β-Ga2O3 (010) substrate by molecular-beam epitaxy. We fabricated a circular MESFET with a gate length of 4 μm and a source–drain spacing of 20 μm. The device showed an ideal transistor action represented by the drain current modulation due to the gate voltage (VGS) swing. A complete drain current pinch-off characteristic was also obtained for VGS < −20 V, and the three-terminal off-state breakdown voltage was over 250 V. A low drain leakage current of 3 μA at the off-state led to a high on/off drain current ratio of about 10 000. These device characteristics obtained at the early stage indicate the great potential of Ga2O3-based electrical devices for future power device applications.

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Metadata

Authors
Higashiwaki, M., Sasaki, K., Kuramata, A., Masui, T., & Yamakoshi, S.
Venue
Applied Physics Letters
Published
2012-01-02
Volume
100
Issue
1
ISSN
  • 0003-6951 (ISSN-L)
  • 1077-3118
OpenAlex
W2020431932
Cited by
1,813
References
0
FWCI
14.45
Type
journal article
Language
en
Open access
closed

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CoChat. (2026). Citation check: Gallium oxide (Ga2O3) metal-semiconductor field-effect transistors on single-crystal β-Ga2O3 (010) substrates. https://app.cochat.ai/papers/10.1063/1.3674287
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Higashiwaki, M., Sasaki, K., Kuramata, A., Masui, T., & Yamakoshi, S. (2012). Gallium oxide (Ga2O3) metal-semiconductor field-effect transistors on single-crystal β-Ga2O3 (010) substrates. Applied Physics Letters. https://doi.org/10.1063/1.3674287

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