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X-ray structural characterization of larger CdSe semiconductor clusters
Abstract
X-ray powder patterns obtained from three different types of 35–40 Å CdSe nanoclusters are analyzed. We simulate the effects of thermal fluctuations, stacking faults, surface reconstructions, and bond compressions on powder patterns of CdSe clusters using the Debye formula. We find that the spectra of capped and annealed CdSe particles grown in inverse micelles are best fit by a mixture of crystalline structures intermediate between zinc-blende and wurtzite. We describe a new preparation for CdSe clusters, the structure of which appears to be well-defined wurtzite with, on average, less than one stacking fault per cluster. Thermal effects are found to be important and to mask the subtle effects of likely surface and core reconstructions.
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Cited by
Synthesis and Characterization of Monodisperse Nanocrystals and Close-Packed Nanocrystal Assemblies
Murray, C. B., Kagan, C. R., & Bawendi, M. G. (2000) · Annual Review of Materials Science · doi:10.1146/annurev.matsci.30.1.545 · Cited by 4,353
Self-citationDabbousi, B. O., Rodriguez-Viejo, J., Mikulec, F. V., Heine, J. R., Mattoussi, H., Ober, R., Jensen, K. F., & Bawendi, M. G. (1997) · The Journal of Physical Chemistry B · doi:10.1021/jp971091y · Cited by 4,229
Self-citationPerspectives on the Physical Chemistry of Semiconductor Nanocrystals
Alivisatos, A. P. (1996) · The Journal of Physical Chemistry · doi:10.1021/jp9535506 · Cited by 3,595
Semiconductor crystallites: a class of large molecules
Steigerwald, M. L., & Brus, L. E. (1990) · Accounts of Chemical Research · doi:10.1021/ar00174a003 · Cited by 992
Self-citationde Mello Donegá, C., Liljeroth, P., & Vanmaekelbergh, D. (2005) · Small · doi:10.1002/smll.200500239 · Cited by 511
Metadata
- Authors
- Bawendi, M. G., Kortan, A. R., Steigerwald, M. L., & Brus, L. E.
- Venue
- The Journal of Chemical Physics
- Publisher
- AIP Publishing
- Published
- 1989-12-01
- Volume
- 91
- Issue
- 11
- Pages
- 7282-7290
- ISSN
- 0021-9606 (ISSN-L)
- 1089-7690
- OpenAlex
- W2083865073
- Cited by
- 281
- References
- 0
- FWCI
- 5.07
- Type
- journal article
- Language
- en
- Open access
- closed
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- Bawendi, M. G., Kortan, A. R., Steigerwald, M. L., & Brus, L. E. (1989). X-ray structural characterization of larger CdSe semiconductor clusters. The Journal of Chemical Physics. https://doi.org/10.1063/1.457295
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