Cited by 31Terahertz technology and applicationsGraphene research and applicationsMicrowave and Dielectric Measurement Techniques

Through-substrate terahertz time-domain reflection spectroscopy for environmental graphene conductivity mapping

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Lin, Hungyen, Burton, Oliver J., Engelbrecht, Sebastian, Tybussek, Kai-Henning, Fischer, Bernd M., Hofmann, Stephan·2020·Applied Physics Letters

Abstract

We demonstrate how terahertz time-domain spectroscopy (THz-TDS) operating in reflection geometry can be used for quantitative conductivity mapping of large area chemical vapor deposited graphene films through silicon support. We validate the technique against measurements performed using the established transmission based THz-TDS. Our through-substrate approach allows unhindered access to the graphene top surface and thus, as we discuss, opens up pathways to perform in situ and in-operando THz-TDS using environmental cells.

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Crossref · 10.1063/1.5135644

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32 of 32 references verified0 citation errors · 0 not checkable

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  • Existing experimental techniques to circumvent phase sensitivity in reflection geometry are often material-specific and cannot be universally applied to all sample types.

    “Despite their effectiveness, these techniques often tend to be material-specific and cannot be universally applied to all sample types.”

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Authors
Lin, H., Burton, O. J., Engelbrecht, S., Tybussek, K.-H., Fischer, B. M., & Hofmann, S.
Affiliations
  • Lancaster University (GB)
  • University of Cambridge (GB)
  • Institut Franco-Allemand de Recherches de Saint-Louis (FR)
Corresponding author
Lin, Hungyen
Venue
Applied Physics Letters
Published
2020-01-13
Volume
116
Issue
2
ISSN
  • 0003-6951 (ISSN-L)
  • 1077-3118
OpenAlex
W2999484451
Cited by
31
References
34
Citations by year
2026: 3 · 2025: 3 · 2024: 5 · 2023: 1 · 2022: 9 · 2021: 4 · 2020: 6
FWCI
1.72
Type
journal article
Language
en
Open access
Locations
  • Applied Physics Letters (publishedVersion, cc-by)
  • Lancaster EPrints (Lancaster University) (submittedVersion)
  • Cambridge University Engineering Department Publications Database (submittedVersion)
Funders
Engineering and Physical Sciences Research Council (EP/R019460/1, EP/K016636/1)
Topics
  • Physical Sciences › Engineering › Electrical and Electronic Engineering › Terahertz technology and applications
  • Physical Sciences › Materials Science › Materials Chemistry › Graphene research and applications
  • Physical Sciences › Engineering › Electrical and Electronic Engineering › Microwave and Dielectric Measurement Techniques
Keywords
terahertz time-domain spectroscopy, reflection geometry, CVD graphene, silicon substrate, in situ measurement, operando measurement, environmental cell, large-area graphene films

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