Far-infrared time-domain spectroscopy with terahertz beams of dielectrics and semiconductors
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Using the method of time-domain spectroscopy, we measure the far-infrared absorption and dispersion from 0.2 to 2 THz of the crystalline dielectrics sapphire and quartz, fused silica, and the semiconductors silicon, gallium arsenide, and germanium. For sapphire and quartz, the measured absorptions are consistent with the earlier work below 0.5 THz. Above 1 THz we measure significantly more absorption for sapphire, while for quartz our values are in reasonable agreement with those of the previous work. Our results on high-purity fused silica are consistent with those on the most transparent fused silica measured to date. For the semiconductors, we show that many of the previous measurements on silicon were dominated by the effects of carriers due to impurities. For high-resistivity, 10-kΩ cm silicon, we measure a remarkable transparency together with an exceptionally nondispersive index of refraction. For GaAs our measurements extend the precision of the previous work, and we resolve two weak absorption features at 0.4 and 0.7 THz. Our measurements on germanium demonstrate the dominant role of intrinsic carriers; the measured absorption and dispersion are well fitted by the simple Drude theory.
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High-resistivity silicon is a typical reference material for THz-TDS and a good starting point to test the method.
“High-resistivity silicon is a typical reference material for THzTDS. Several historical studies have been published since the emergence of the THz-TDS field [4, 41, 16, 42], hence this type of sample is a good starting point to test our method.”
From THz-TDS Time-Trace Analysis for the Extraction of Material and Metamaterial Parameters (2019) · cites this paper as [4]
Terahertz time-domain spectroscopy systems based on femtosecond lasers measure the electric field by sampling the terahertz pulse versus delay.
“This can be done using THz time-domain spectroscopy ͑THz-TDS͒ systems based on femtosecond lasers.7 The electric field is measured by sampling the THz pulse as a function of delay, typically using a mechanical delay line.”
From Highly sensitive terahertz measurement of layer thickness using a two-cylinder waveguide sensor (2010) · cites this paper as [7]
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A New Metric for the Comparison of Permittivity Models in Terahertz Time-Domain Spectroscopy
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“…Spectroscopy Melanie Lavancier , Nabil Vindas-Yassine, Juliette Vlieghe, Theo Hannotte , Jean-François Lampin, François Orieux , and Romain Peretti Abstract —Wepresent a robust method, as well as a new metric, forthecomparisonofpermittivitymodelsinterahertztime-domain spectroscopy(THz-TDS).”
MethodTerahertz time domain spectroscopy data processing: analysing uncertainties to push boundaries
Lavancier, M., Eliet Barois, S., Denakpo, E., Vlieghe, J., Vindas, N., Hindle, F., Cuisset, A., & Peretti, R. (2022) · Terahertz Photonics II · doi:10.1117/12.2620069 · Cited by 2 · see citing works
Okano, M., Suyama, K., Wada, A., & Tanaka, S. (2025) · Journal of the Optical Society of America B · doi:10.1364/josab.560569
Cha, M., Ryeom, J., Kang, B. J., Park, H., Jang, H., Hong, S. J., & Bahk, Y.-M. (2026) · Journal of Infrared, Millimeter and Terahertz Waves · doi:10.1007/s10762-026-01162-z
Goumarre, V., Amarasinghe, Y., Henriksen, M. L., Hinge, M., & Klarskov, P. (2024) · arXiv · doi:10.48550/arxiv.2403.18531
Advanced Data Processing of THz-Time Domain Spectroscopy Data with Sinusoidally Moving Delay Lines
Vogel, T., & Saraceno, C. J. (2024) · arXiv
- Authors
- Grischkowsky, D., Keiding, S., van Exter, M., & Fattinger, C.
- Affiliations
- IBM Research - Thomas J. Watson Research Center (US)
- Venue
- Journal of the Optical Society of America B
- Publisher
- Optica Publishing Group
- Published
- 1990-10-01
- Volume
- 7
- Issue
- 10
- Pages
- 2006
- ISSN
- 0740-3224 (ISSN-L)
- 1520-8540
- OpenAlex
- W2126442445
- Cited by
- 2,239
- References
- 43
- Citations by year
- 2026: 50 · 2025: 67 · 2024: 74 · 2023: 69 · 2022: 73 · 2021: 87 · 2020: 89 · 2019: 91 · 2018: 98 · 2017: 94 · 2016: 96 · 2015: 103 · 2014: 94 · 2013: 105 · 2012: 105
- FWCI
- 15.31
- Type
- journal article
- Language
- en
- Open access
- green
- doi.org
- Licence
- Locations
- Journal of the Optical Society of America B (publishedVersion)
- SHAREOK (University of Oklahoma; Oklahoma State University; Central Oklahoma University) (acceptedVersion, other-oa)
- SHAREOK (University of Oklahoma; Oklahoma State University; Central Oklahoma University) (submittedVersion, other-oa)
- Topics
- Physical Sciences › Engineering › Electrical and Electronic Engineering › Terahertz technology and applications
- Physical Sciences › Physics and Astronomy › Atomic and Molecular Physics, and Optics › Laser-Matter Interactions and Applications
- Physical Sciences › Chemistry › Spectroscopy › Spectroscopy and Laser Applications
- Keywords
- far-infrared absorption, terahertz spectroscopy, time-domain spectroscopy, dielectric materials, semiconductors, sapphire, quartz, fused silica, silicon, GaAs, germanium, refractive index dispersion, Drude model, high-purity silicon
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