The DOI matches its Crossref record; 27 of the 27 references it cites were found in a registry or an index.
Refractive index of silicon and germanium and its wavelength and temperature derivatives
Abstract
Refractive index data for silicon and germanium were searched, compiled, and analyzed. Recommended values of refractive index for the transparent spectral region were generated in the ranges 1.2 to 14 μm and 100–740 K for silicon, and 1.9 to 16 μm and 100–550 K for germanium. Generation of these values was based on a dispersion equation which best fits selected data sets covering wide temperature and wavelength ranges. Temperature derivative of refractive index was simply calculated from the first derivative of the equation with respect to temperature. The results are in concordance with the existing dn/dT data.
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In the terahertz frequency range, the value of M is uniquely and easily determined by extrapolating Δφ(ω) to ω=0, where ΔΦ_abs should be always zero.
“However, in the terahertz frequency range, the value of M is uniquely and easily determined by extrapolating Δ ϕ ( ω ) to ω =0, where Δ Φ abs should be always zero.”
From Ultra-precise determination of thicknesses and refractive indices of optically thick dispersive materials by dual-comb spectroscopy (2022) · cites this paper as [35]
A similar analytical procedure has been proposed to determine d in the terahertz frequency range, and this idea has been applied to the characterization of various materials.
“Note that a similar analytical procedure has been proposed to determine d in the terahertz frequency range 34,35 , and this idea has been applied to the characterization of various materials 36,37,38,39 .”
From Ultra-precise determination of thicknesses and refractive indices of optically thick dispersive materials by dual-comb spectroscopy (2022) · cites this paper as [35]
Citations
Cites
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Tanner, D. B. (2019) · doi:10.1017/9781316672778 · Cited by 106
Sumihara, K. A., Okubo, S., Okano, M., Inaba, H., & Watanabe, S. (2022) · Optics Express · doi:10.1364/oe.445134 · Cited by 13
Metadata
- Authors
- Li, H. H.
- Affiliations
- Purdue University West Lafayette (US)
- Corresponding author
- Li, H. H.
- Venue
- Journal of Physical and Chemical Reference Data
- Publisher
- AIP Publishing
- Published
- 1980-07-01
- Volume
- 9
- Issue
- 3
- Pages
- 561-658
- ISSN
- 0047-2689 (ISSN-L)
- 1529-7845
- OpenAlex
- W2017046529
- Cited by
- 863
- References
- 27
- Citations by year
- 2026: 54 · 2025: 51 · 2024: 71 · 2023: 58 · 2022: 49 · 2021: 66 · 2020: 50 · 2019: 86 · 2018: 59 · 2017: 44 · 2016: 39 · 2015: 24 · 2014: 35 · 2013: 20 · 2012: 18
- FWCI
- 0.28
- Type
- journal article
- Language
- en
- Open access
- closed
- Locations
- Journal of Physical and Chemical Reference Data (publishedVersion)
- Defense Technical Information Center (DTIC) (submittedVersion)
- Topics
- Physical Sciences › Physics and Astronomy › Atomic and Molecular Physics, and Optics › Optical and Acousto-Optic Technologies
- Physical Sciences › Engineering › Aerospace Engineering › Calibration and Measurement Techniques
- Physical Sciences › Engineering › Electrical and Electronic Engineering › Photonic and Optical Devices
- Keywords
- refractive index, silicon, germanium, dispersion relation, wavelength dependence, temperature dependence, infrared spectra, optical constants
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