The DOI matches its Crossref record.
Scanning thermal profiler
Abstract
A new high-resolution profilometer has been demonstrated based upon a noncontacting near-field thermal probe. The thermal probe consists of a thermocouple sensor with dimensions approaching 100 nm. Profiling is achieved by scanning the heated sensor above but close to the surface of a solid. The conduction of heat between tip and sample via the air provides a means for maintaining the sample spacing constant during the lateral scan. The large difference in thermal properties between air and solids makes the profiling technique essentially independent of the material properties of the solid. Noncontact profiling of resist and metal films has shown a lateral resolution of 100 nm and a depth solution of 3 nm. The basic theory of the new probe is described and the results presented.
Overview
The claims and statistics of this paper haven’t been checked yet.
Run the check — free, no account needed. It reads the open-access text and checks the sources it cites.
Integrity signals
Registry
Cites
Statistics
Verification
Claims the paper makes
The claims and statistics of this paper haven’t been checked yet.
Run the check — free, no account needed. It reads the open-access text and checks the sources it cites.
Self-check
Percentages, sums and reported differences re-computed from the paper’s own numbers.
The self-check needs the paper’s full text.
Citations
Cited by
Cahill, D. G., Ford, W. K., Goodson, K. E., Mahan, G. D., Majumdar, A., Maris, H. J., Merlin, R., & Phillpot, S. R. (2003) · Journal of Applied Physics · doi:10.1063/1.1524305 · Cited by 2,825
Thermometry and Thermal Transport in Micro/Nanoscale Solid-State Devices and Structures
Cahill, D. G., Goodson, K., & Majumdar, A. (2002) · Journal of Heat Transfer · doi:10.1115/1.1454111 · Cited by 611
Thermal imaging using the atomic force microscope
Majumdar, A., Carrejo, J. P., & Lai, J. (1993) · Applied Physics Letters · doi:10.1063/1.109335 · Cited by 254
Phonon thermal conduction in novel 2D materials
Xu, X., Chen, J., & Li, B. (2016) · Journal of Physics: Condensed Matter · doi:10.1088/0953-8984/28/48/483001 · Cited by 137
Metadata
- Authors
- Williams, C. C., & Wickramasinghe, H. K.
- Venue
- Applied Physics Letters
- Publisher
- AIP Publishing
- Published
- 1986-12-08
- Volume
- 49
- Issue
- 23
- Pages
- 1587-1589
- ISSN
- 0003-6951 (ISSN-L)
- 1077-3118
- OpenAlex
- W2057567599
- Cited by
- 413
- References
- 0
- FWCI
- 17.30
- Type
- journal article
- Language
- en
- Open access
- closed
About these checks
Registry, retraction, Cites and statistics results are computed, not judged, with one exception: a printed reference that no index lists is read once by a model before it counts as a citation error. Claims are extracted by a model and kept only when their quote appears verbatim in the text; each cited source is then checked, with a model’s help, for whether it says what the claim relies on. Those verdicts can be wrong — read the claim’s quote and the cited source before relying on one.
Statistics and arithmetic are recomputed, not judged.
Confidence bands are shown only for fields calibrated on our annotated test set. None is calibrated yet, so no band is shown.
What counts as a claim ›How we measure confidence ›How we check this ›
Are you an author, or do you see a problem with this page? Request a review
How to cite
Cite CoChat for the checks on this page, and the paper for its own findings.
- This page
- CoChat. (2026). Citation check: Scanning thermal profiler. https://app.cochat.ai/papers/10.1063/1.97288
- The paper
- Williams, C. C., & Wickramasinghe, H. K. (1986). Scanning thermal profiler. Applied Physics Letters. https://doi.org/10.1063/1.97288
Data sources
Bibliographic data: Semantic Scholar, OpenAlex, Crossref.
Contains information from the Semantic Scholar Academic Graph Datasets, made available under the ODC Attribution License (ODC-BY 1.0).
Semantic Scholar’s data is described in: Kinney, R., et al. (2023). The Semantic Scholar Open Data Platform. arXiv:2301.10140.