The DOI matches its Crossref record; 2 of the 2 references it cites were found in a registry or an index.
An Analysis for Unreplicated Fractional Factorials
Abstract
Loss of markets to Japan has recently caused attention to return to the enormous potential that experimental design possesses for the improvement of product design, for the improvement of the manufacturing process, and hence for improvement of overall product quality. In the screening stage of industrial experimentation it is frequently true that the “Pareto Principle” applies; that is, a large proportion of process variation is associated with a small proportion of the process variables. In such circumstances of “factor sparsity,” unreplicated fractional designs and other orthogonal arrays have frequently been effective when used as a screen for isolating preponderant factors. A useful graphical analysis due to Daniel (1959) employs normal probability plotting. A more formal analysis is presented here, which may be used to supplement such plots and hence to facilitate the use of these unreplicated experimental arrangements.
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Citations
Cites
Fisher, R. A. (1936) · BMJ · doi:10.1136/bmj.1.3923.554-a · Cited by 4,980
Use of Half-Normal Plots in Interpreting Factorial Two-Level Experiments
Daniel, C. (1959) · Technometrics · doi:10.1080/00401706.1959.10489866 · Cited by 798
Cited by
Factorial Sampling Plans for Preliminary Computational Experiments
Morris, M. D. (1991) · Technometrics · doi:10.1080/00401706.1991.10484804 · Cited by 4,943
Screening, Predicting, and Computer Experiments
Welch, W. J., Buck, R. J., Sacks, J., Wynn, H. P., Mitchell, T. J., & Morris, M. D. (1992) · Technometrics · doi:10.2307/1269548 · Cited by 630
Quick and Easy Analysis of Unreplicated Factorials
Lenth, R. V. (1989) · Technometrics · doi:10.1080/00401706.1989.10488595 · Cited by 607
Collins, L. M., Dziak, J. J., & Li, R. (2009) · Psychological Methods · doi:10.1037/a0015826 · Cited by 431
Shaping program repair space with existing patches and similar code
Jiang, J., Xiong, Y., Zhang, H., Gao, Q., & Chen, X. (2018) · Proceedings of the 27th ACM SIGSOFT International Symposium on Software Testing and Analysis · doi:10.1145/3213846.3213871 · Cited by 329
Metadata
- Authors
- Box, G. E. P., & Meyer, R. D.
- Venue
- Technometrics
- Publisher
- Informa UK Limited
- Published
- 1986-02
- Volume
- 28
- Issue
- 1
- Pages
- 11-18
- ISSN
- 0040-1706 (ISSN-L)
- 1537-2723
- OpenAlex
- W1964105999
- Cited by
- 576
- References
- 2
- FWCI
- 9.29
- Type
- journal article
- Language
- en
- Open access
- closed
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