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Using Degradation Measures to Estimate a Time-to-Failure Distribution
Abstract
Some life tests result in few or no failures. In such cases, it is difficult to assess reliability with traditional life tests that record only time to failure. For some devices, it is possible to obtain degradation measurements over time, and these measurements may contain useful information about product reliability. Even with little or no censoring, there may be important practical advantages to analyzing degradation data. If failure is defined in terms of a specified level of degradation, a degradation model defines a particular time-to-failure distribution. Generally it is not possible to obtain a closed-form expression for this distribution. The purpose of this work is to develop statistical methods for using degradation measures to estimate a time-to-failure distribution for a broad class of degradation models. We use a nonlinear mixed-effects model and develop methods based on Monte Carlo simulation to obtain point estimates and confidence intervals for reliability assessment.
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The Jackknife, the Bootstrap and Other Resampling Plans
Efron, B. (1982) · Society for Industrial and Applied Mathematics eBooks · doi:10.1137/1.9781611970319 · Cited by 8,120
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A review of bootstrap confidence intervals
Diciccio, T. J., & Romano, J. P. (1988) · Journal of the Royal Statistical Society Series B: Statistical Methodology · doi:10.1111/j.2517-6161.1988.tb01732.x · Cited by 314
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Lei, Y., Li, N., Guo, L., Li, N., Yan, T., & Lin, J. (2018) · Mechanical Systems and Signal Processing · doi:10.1016/j.ymssp.2017.11.016 · Cited by 2,634
Remaining useful life estimation – A review on the statistical data driven approaches
Si, X.-S., Wang, W., Hu, C.-H., & Zhou, D.-H. (2011) · European Journal of Operational Research · doi:10.1016/j.ejor.2010.11.018 · Cited by 2,162
Residual-life distributions from component degradation signals: A Bayesian approach
GEBRAEEL, N. Z., LAWLEY, M. A., LI, R., & RYAN, J. K. (2005) · IIE Transactions · doi:10.1080/07408170590929018 · Cited by 788
Accelerated Degradation Models for Failure Based on Geometric Brownian Motion and Gamma Processes
Park, C., & Padgett, W. J. (2005) · Lifetime Data Analysis · doi:10.1007/s10985-005-5237-8 · Cited by 441
Metadata
- Authors
- Lu, C. J., & Meeker, W. O.
- Venue
- Technometrics
- Publisher
- Informa UK Limited
- Published
- 1993-05
- Volume
- 35
- Issue
- 2
- Pages
- 161-174
- ISSN
- 0040-1706 (ISSN-L)
- 1537-2723
- OpenAlex
- W2090749763
- Cited by
- 1,161
- References
- 3
- FWCI
- 23.62
- Type
- journal article
- Language
- en
- Open access
- closed
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