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Broadband emissivity calibration of highly reflective samples at cryogenic temperatures
Abstract
We have developed a technique for measuring the broadband optical emissivity of high reflectivity samples at cryogenic temperatures. This measurement method employs a primary standard optical detector with high absorptance from visible wavelengths to beyond 200 µm. Background subtraction and quantification allow determination of the emissivity with total absolute uncertainty (k = 1) between approximately 0.0002 and 0.002 (for emissivities between 0.0035 and 0.092) over the temperature range from 80 K to 300 K. Using the irradiance data at the detector, precise measurements of the experimental geometry and diffraction calculations, the optical power emitted by the sample can be determined. Contact thermometry measurements for the sample can then be used to find its emissivity. The emissivity calibration technique is demonstrated for large plate samples made from polished stainless steel and is also extended to calculate the separate emissivities of multiple distinct regions on a more complex sample assembly.
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Woods et al. (2012) at NIST developed a low-uncertainty, absolutely calibrated emissivity measurement system for the precise characterization of highly reflective materials.
“In 2012, Woods et al. [48] at the National Institute of Standards and Technology (NIST) developed a low-uncertainty, absolutely calibrated emissivity measurement system for the precise characterization of highly reflective materials.”
From Thermal Radiation Testing Methods at Cryogenic Temperatures: A Review (2026) · cites this paper as [48]
By incorporating shutter-partitioning technology, the Woods et al. system allowed independent emissivity measurements of multiple microregions on the same sample surface.
“By incorporating shutterpartitioning technology, it allowed independent emissivity measurements of multiple microregions on the same sample surface.”
From Thermal Radiation Testing Methods at Cryogenic Temperatures: A Review (2026) · cites this paper as [48]
The Woods et al. system enabled precise emissivity measurements of polished 304 stainless steel across the 80-300 K temperature range.
“Based on the radiometric method, this system enabled precise emissivity measurements of polished 304 stainless steel across the 80-300 K temperature range [38].”
From Thermal Radiation Testing Methods at Cryogenic Temperatures: A Review (2026) · cites this paper as [48]
The Woods et al. apparatus employed a helium-cooled, high-absorption, low-noise absolute cryogenic radiometer as the detector.
“The apparatus employed a heliumcooled, high-absorption, low-noise absolute cryogenic radiometer as the detector.”
From Thermal Radiation Testing Methods at Cryogenic Temperatures: A Review (2026) · cites this paper as [48]
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No references could be resolved yet.
Research works printed but not linked: 14
- Ageladarakis P A Obert W DewHughes D, 1998, Cryogenic Engineering Conf. 1998, 715
- Lipa M Martinez A Lacroix B Chatain D, 2009, 23rd IEEE/NPSS Symp. on Fusion Engineering, 603
- 10.1016/j.cryogenics.2008.07.007 · DOI · Paper page
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- 10.1016/j.cryogenics.2004.11.010 · DOI · Paper page
- 10.1364/JOSA.69.001384 · DOI
- 10.1364/AO.31.007219 · DOI
- Houston J M, 2006, Metrologia, 43, S31, 10.1088/0026-1394/43/2/S07 · DOI
- 10.1364/AO.44.000871 · DOI
- 10.1364/AO.40.004463 · DOI
- 10.1016/S1079-4042(05)41009-7 · DOI
- 10.1016/S1079-4042(05)41001-2 · DOI
- 10.1364/JOSA.68.001505 · DOI
Cited by
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Thermal Radiation Testing Methods at Cryogenic Temperatures: A Review
Li, B., & Shen, F. (2026) · Cryo · doi:10.3390/cryo2010004 · Cited by 1
Metadata
- Authors
- Woods, S. I., Jung, T. M., Ly, G. T., & Yu, J.
- Venue
- Metrologia
- Publisher
- IOP Publishing
- Published
- 2012-10-15
- Volume
- 49
- Issue
- 6
- Pages
- 737-744
- ISSN
- 0026-1394
- 1681-7575
- Cited by
- 10
- References
- 0
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