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Surface X-ray diffraction

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Robinson, I K, Tweet, D J·1992·Reports on Progress in Physics

Abstract

A general introduction to X-ray diffraction and its application to the study of surfaces and interfaces is presented. The application of X-ray diffraction to various problems in surface and interface science is illustrated through five different techniques: crystal truncation rod analysis; two-dimensional crystallography; three-dimensional structure analysis; the evanescent wave method; and lineshape analysis. These techniques are explained with numerous examples from experiments and with the aid of an extensive bibliography.

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Metadata

Authors
Robinson, I. K., & Tweet, D. J.
Venue
Reports on Progress in Physics
Published
1992-05-01
Volume
55
Issue
5
Pages
599-651
ISSN
  • 0034-4885 (ISSN-L)
  • 1361-6633
OpenAlex
W2012460201
Cited by
766
References
0
FWCI
15.89
Type
journal article
Language
en
Open access
bronze

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CoChat. (2026). Citation check: Surface X-ray diffraction. https://app.cochat.ai/papers/10.1088/0034-4885/55/5/002
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Robinson, I. K., & Tweet, D. J. (1992). Surface X-ray diffraction. Reports on Progress in Physics. https://doi.org/10.1088/0034-4885/55/5/002

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Contains information from the Semantic Scholar Academic Graph Datasets, made available under the ODC Attribution License (ODC-BY 1.0).

Semantic Scholar’s data is described in: Kinney, R., et al. (2023). The Semantic Scholar Open Data Platform. arXiv:2301.10140.