Cited by 8Chaos control and synchronizationQuantum and electron transport phenomenaQuantum chaos and dynamical systems

The DOI matches its Crossref record; 35 of the 35 references it cites were found in a registry or an index.

Chaotic carrier transport induced by impact ionization in semiconductors

Aoki, K·1992·Semiconductor Science and Technology

Abstract

Chaotic carrier transport induced by impact ionization of neutral impurities (i.e. impurity avalanche breakdown at low temperature) in semiconductors (e.g. GaAs Ge, InSb) has been summarized. Viewed over the wide spectrum of the observations, a universality class of low-dimensional dissipative chaos is recognized in the related nonlinear carrier transport. Among various types of the current instabilities reviewed, driven chaos and crossover instability in n-GaAs have been used as examples to show typical low-dimensional chaos. High-dimensional complex behaviour of the current instability has also been discussed.

Overview

Integrity signals

Registry

Crossref · 10.1088/0268-1242/7/3b/123

Cites

35 of 35 references verified0 citation errors · 0 not checkable

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Verification

Claims the paper makes

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  • Random charging is attributed to random carrier generation dominated by the random number of collision events during impact ionization near the drain, and accidental discharging is ascribed to random carrier escapes led by out-diffusion from the FB to the source.

    “The random charging is attributed to random carrier generation dominated by the random number of collision events during impact ionization near D (37, 38), and the accidental discharging is ascribed to random carrier escapes led by out-diffusion from the FB to S.”

Citations

Cites

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Research works printed but not linked: 2

  1. Röhricht B, 1985, Physica, 134, 281
  2. Schöll E, 1985, Physica, 134, 271

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Metadata

Authors
Aoki, K.
Affiliations
Kobe University (JP)
Corresponding author
Aoki, K
ORCID
Aoki, K
Venue
Semiconductor Science and Technology
Published
1992-03-01
Volume
7
Issue
3B
Pages
B474-B479
ISSN
  • 0268-1242 (ISSN-L)
  • 1361-6641
OpenAlex
W2080038164
Cited by
8
References
35
Citations by year
2026: 1 · 2025: 1 · 2024: 1
FWCI
1.12
Type
journal article
Language
en
Open access
closed
Locations
Semiconductor Science and Technology (publishedVersion)
Topics
  • Physical Sciences › Physics and Astronomy › Statistical and Nonlinear Physics › Chaos control and synchronization
  • Physical Sciences › Physics and Astronomy › Condensed Matter Physics › Quantum and electron transport phenomena
  • Physical Sciences › Physics and Astronomy › Statistical and Nonlinear Physics › Quantum chaos and dynamical systems
Keywords
impact ionization, current instability, n-GaAs, indium antimonide, Ge, universality class

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