The DOI matches its Crossref record; 126 of the 126 references it cites were found in a registry or an index.
Strain engineering in semiconducting two-dimensional crystals
Open accessAbstract
One of the fascinating properties of the new families of two-dimensional crystals is their high stretchability and the possibility to use external strain to manipulate, in a controlled manner, their optical and electronic properties. Strain engineering, understood as the field that study how the physical properties of materials can be tuned by controlling the elastic strain fields applied to it, has a perfect platform for its implementation in the atomically thin semiconducting materials. The object of this review is to give an overview of the recent progress to control the optical and electronics properties of 2D crystals, by means of strain engineering. We will concentrate on semiconducting layered materials, with especial emphasis in transition metal dichalcogenides (MoS2, WS2, MoSe2 and WSe2). The effect of strain in other atomically thin materials like black phosphorus, silicene, etc, is also considered. The benefits of strain engineering in 2D crystals for applications in nanoelectronics and optoelectronics will be revised, and the open problems in the field will be discussed.
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Cites
Electric Field Effect in Atomically Thin Carbon Films
Novoselov, K. S., Geim, A. K., Morozov, S. V., Jiang, D., Zhang, Y., Dubonos, S. V., Grigorieva, I. V., & Firsov, A. A. (2004) · Science · doi:10.1126/science.1102896 · Cited by 66,834
The electronic properties of graphene
Castro Neto, A. H., Guinea, F., Peres, N. M. R., Novoselov, K. S., & Geim, A. K. (2009) · Reviews of Modern Physics · doi:10.1103/revmodphys.81.109 · Cited by 24,803
Self-citationElectronics and optoelectronics of two-dimensional transition metal dichalcogenides
Wang, Q. H., Kalantar-Zadeh, K., Kis, A., Coleman, J. N., & Strano, M. S. (2012) · Nature Nanotechnology · doi:10.1038/nnano.2012.193 · Cited by 16,374
Atomically Thin MoS 2 : A New Direct-Gap Semiconductor
Mak, K. F., Lee, C., Hone, J., Shan, J., & Heinz, T. F. (2010) · Physical Review Letters · doi:10.1103/physrevlett.105.136805 · Cited by 15,586
Radisavljevic, B., Radenovic, A., Brivio, J., Giacometti, V., & Kis, A. (2011) · Nature Nanotechnology · doi:10.1038/nnano.2010.279 · Cited by 14,939
Two-dimensional atomic crystals
Novoselov, K. S., Jiang, D., Schedin, F., Booth, T. J., Khotkevich, V. V., Morozov, S. V., & Geim, A. K. (2005) · Proceedings of the National Academy of Sciences · doi:10.1073/pnas.0502848102 · Cited by 11,788
VI. The phenomena of rupture and flow in solids
Griffith, A. A. (1921) · Philosophical Transactions of the Royal Society of London. Series A, Containing Papers of a Mathematical or Physical Character · doi:10.1098/rsta.1921.0006 · Cited by 11,052
Emerging Photoluminescence in Monolayer MoS2
Splendiani, A., Sun, L., Zhang, Y., Li, T., Kim, J., Chim, C.-Y., Galli, G., & Wang, F. (2010) · Nano Letters · doi:10.1021/nl903868w · Cited by 9,501
Two-Dimensional Nanosheets Produced by Liquid Exfoliation of Layered Materials
Coleman, J. N., Lotya, M., O’Neill, A., Bergin, S. D., King, P. J., Khan, U., Young, K., Gaucher, A., De, S., Smith, R. J., et al. (2011) · Science · doi:10.1126/science.1194975 · Cited by 7,242
Boron nitride substrates for high-quality graphene electronics
Dean, C. R., Young, A. F., Meric, I., Lee, C., Wang, L., Sorgenfrei, S., Watanabe, K., Taniguchi, T., Kim, P., Shepard, K. L., et al. (2010) · Nature Nanotechnology · doi:10.1038/nnano.2010.172 · Cited by 7,124
Cited by
Band Gap Engineering with Ultralarge Biaxial Strains in Suspended Monolayer MoS2
Lloyd, D., Liu, X., Christopher, J. W., Cantley, L., Wadehra, A., Kim, B. L., Goldberg, B. B., Swan, A. K., & Bunch, J. S. (2016) · Nano Letters · doi:10.1021/acs.nanolett.6b02615 · Cited by 624
Grosso, G., Moon, H., Lienhard, B., Ali, S., Efetov, D. K., Furchi, M. M., Jarillo-Herrero, P., Ford, M. J., Aharonovich, I., & Englund, D. (2017) · Nature Communications · doi:10.1038/s41467-017-00810-2 · Cited by 561
2D Material Based Synaptic Devices for Neuromorphic Computing
Cao, G., Meng, P., Chen, J., Liu, H., Bian, R., Zhu, C., Liu, F., & Liu, Z. (2021) · Advanced Functional Materials · doi:10.1002/adfm.202005443 · Cited by 382
Strain-Induced Spatial and Spectral Isolation of Quantum Emitters in Mono- and Bilayer WSe2
Kumar, S., Kaczmarczyk, A., & Gerardot, B. D. (2015) · Nano Letters · doi:10.1021/acs.nanolett.5b03312 · Cited by 316
Ghosh, R., Singh, M., Chang, L. W., Lin, H.-I., Chen, Y. S., Muthu, J., Papnai, B., Kang, Y. S., Liao, Y.-M., Bera, K. P., et al. (2022) · ACS Nano · doi:10.1021/acsnano.1c10772 · Cited by 49
Metadata
- Authors
- Roldán, R., Castellanos-Gomez, A., Cappelluti, E., & Guinea, F.
- Venue
- Journal of Physics: Condensed Matter
- Publisher
- IOP Publishing
- Published
- 2015-07-22
- Volume
- 27
- Issue
- 31
- Pages
- 313201
- ISSN
- 0953-8984 (ISSN-L)
- 1361-648X
- OpenAlex
- W2128414648
- Cited by
- 527
- References
- 126
- FWCI
- 15.59
- Type
- journal article
- Language
- en
- Open access
- bronze
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