Student or educator? Sign up with your school email and get 6 months of Pro free.
Cited by 450

The DOI matches its Crossref record; 15 of the 15 references it cites were found in a registry or an index.

Capacitance, admittance, and rectification properties of small conductors

Open access
Buttiker, M·1993·Journal of Physics: Condensed Matter

Abstract

We formulate microscopic expressions for capacitances, admittances and the rectification properties for small phase-coherent samples consisting of a number of metallic layers separated by insulators. The electric potential in such a structure is discussed with the help of characteristic functions which determine the variation of the microscopic potential inside the sample in response to an increase of the electro-chemical potential at a contact. An electrochemical capacitance matrix is derived which allows for field penetration into the conductor. We discuss the admittance matrix for conductors with nearby capacitors (gates) and analyse its magnetic field symmetry. We use the characteristic potentials to discuss the rectification properties of a conduction channel in the presence of nearby capacitors.

Overview

The claims and statistics of this paper haven’t been checked yet.

Run the check — free, no account needed. It reads the open-access text and checks the sources it cites.

A few free checks a day · papers already verified open instantly · results are public

Integrity signals

Registry

Crossref · 10.1088/0953-8984/5/50/017

Cites

15 of 15 references verified0 citation errors · 0 not checkable

Statistics

Verification

Claims the paper makes

The claims and statistics of this paper haven’t been checked yet.

Run the check — free, no account needed. It reads the open-access text and checks the sources it cites.

A few free checks a day · papers already verified open instantly · results are public

Self-check

Percentages, sums and reported differences re-computed from the paper’s own numbers.

The self-check needs the paper’s full text.

Citations

Cites

Show all 15 references

Cited by

See all 450

Metadata

Authors
Buttiker, M.
Venue
Journal of Physics: Condensed Matter
Published
1993-12-13
Volume
5
Issue
50
Pages
9361-9378
ISSN
  • 0953-8984 (ISSN-L)
  • 1361-648X
OpenAlex
W1999542757
Cited by
450
References
15
FWCI
8.84
Type
journal article
Language
en
Open access
bronze

About these checks

Registry, retraction, Cites and statistics results are computed, not judged, with one exception: a printed reference that no index lists is read once by a model before it counts as a citation error. Claims are extracted by a model and kept only when their quote appears verbatim in the text; each cited source is then checked, with a model’s help, for whether it says what the claim relies on. Those verdicts can be wrong — read the claim’s quote and the cited source before relying on one.

Statistics and arithmetic are recomputed, not judged.

Confidence bands are shown only for fields calibrated on our annotated test set. None is calibrated yet, so no band is shown.

What counts as a claim ›How we measure confidence ›How we check this ›

Are you an author, or do you see a problem with this page? Request a review

How to cite

Cite CoChat for the checks on this page, and the paper for its own findings.

This page
CoChat. (2026). Citation check: Capacitance, admittance, and rectification properties of small conductors. https://app.cochat.ai/papers/10.1088/0953-8984/5/50/017
The paper
Buttiker, M. (1993). Capacitance, admittance, and rectification properties of small conductors. Journal of Physics: Condensed Matter. https://doi.org/10.1088/0953-8984/5/50/017

Data sources

Bibliographic data: Semantic Scholar, OpenAlex, Crossref.

Contains information from the Semantic Scholar Academic Graph Datasets, made available under the ODC Attribution License (ODC-BY 1.0).

Semantic Scholar’s data is described in: Kinney, R., et al. (2023). The Semantic Scholar Open Data Platform. arXiv:2301.10140.