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SU-8: a photoresist for high-aspect-ratio and 3D submicron lithography

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Campo, A del, Greiner, C·2007·Journal of Micromechanics and Microengineering

Abstract

SU-8 has become the favourite photoresist for high-aspect-ratio (HAR) and three-dimensional (3D) lithographic patterning due to its excellent coating, planarization and processing properties as well as its mechanical and chemical stability. However, as feature sizes get smaller and pattern complexity increases, particular difficulties and a number of material-related issues arise and need to be carefully considered. This review presents a detailed description of these effects and describes reported strategies and achieved SU-8 HAR and 3D structures up to August 2006.

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Metadata

Authors
Campo, A. D., & Greiner, C.
Venue
Journal of Micromechanics and Microengineering
Published
2007-05-15
Volume
17
Issue
6
Pages
R81-R95
ISSN
  • 0960-1317 (ISSN-L)
  • 1361-6439
OpenAlex
W1971870134
Cited by
825
References
0
FWCI
28.04
Type
journal article
Language
en
Open access
bronze

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CoChat. (2026). Citation check: SU-8: a photoresist for high-aspect-ratio and 3D submicron lithography. https://app.cochat.ai/papers/10.1088/0960-1317/17/6/r01
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Campo, A. D., & Greiner, C. (2007). SU-8: a photoresist for high-aspect-ratio and 3D submicron lithography. Journal of Micromechanics and Microengineering. https://doi.org/10.1088/0960-1317/17/6/r01

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Contains information from the Semantic Scholar Academic Graph Datasets, made available under the ODC Attribution License (ODC-BY 1.0).

Semantic Scholar’s data is described in: Kinney, R., et al. (2023). The Semantic Scholar Open Data Platform. arXiv:2301.10140.