Cited by 87Quantum Information and CryptographyCold Atom Physics and Bose-Einstein CondensatesQuantum Mechanics and Applications

Reliable transport through a microfabricated X -junction surface-electrode ion trap

Open access
Wright, Kenneth, Amini, Jason M, Faircloth, Daniel L, Volin, Curtis, Charles Doret, S, Hayden, Harley, Pai, C-S, Landgren, David W +4 more·2013·New Journal of Physics

Abstract

We report the design, fabrication and characterization of a microfabricated surface-electrode ion trap that supports controlled transport through the two-dimensional intersection of linear trapping zones arranged in a 90° cross. The trap is fabricated with very large scalable integration techniques which are compatible with scaling to a large quantum information processor. The shape of the radio-frequency electrodes is optimized with a genetic algorithm to reduce axial pseudopotential barriers and minimize ion heating during transport. Seventy-eight independent dc control electrodes enable fine control of the trapping potentials. We demonstrate reliable ion transport between junction legs and determine the rate of ion loss due to transport. Doppler-cooled ions survive more than 10 5 round-trip transits between junction legs without loss and more than 65 consecutive round trips without laser cooling.

Integrity signals

Registry

Crossref · 10.1088/1367-2630/15/3/033004

Cites

4 of 4 references verified0 citation errors · 0 not checkable

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Each is checked against this paper’s own text: does it say what the citing paper says it does?

  • Helios uses a four-way 'X' junction to connect memory regions to quantum logic regions without increasing electrical control or device fabrication complexity.

    “Second, Helios uses a four-way ‘X’ junction10,11,29–35 to connect memory regions to quantum logic regions without increasing electrical control or device fabrication complexity.”

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Authors
Wright, K., Amini, J. M., Faircloth, D. L., Volin, C., Charles Doret, S., Hayden, H., Pai, C.-S., Landgren, D. W., Denison, D., Killian, T., Slusher, R. E., & Harter, A. W.
Affiliations
Georgia Tech Research Institute (US)
Corresponding author
Amini, Jason M
Venue
New Journal of Physics
Published
2013-03-04
Volume
15
Issue
3
Pages
033004
ISSN
1367-2630 (ISSN-L)
OpenAlex
W2169738367
Cited by
87
References
4
Citations by year
2026: 5 · 2025: 4 · 2024: 4 · 2023: 6 · 2022: 5 · 2021: 6 · 2020: 8 · 2019: 7 · 2018: 3 · 2017: 9 · 2016: 5 · 2015: 11 · 2014: 9 · 2013: 4 · 2012: 1
FWCI
10.69
Type
journal article
Language
en
Open access
Locations
  • New Journal of Physics (publishedVersion, cc-by-nc-sa)
  • arXiv (Cornell University) (submittedVersion)
  • DOAJ (DOAJ: Directory of Open Access Journals) (submittedVersion)
  • arXiv (Cornell University)
Funders
  • Research Institute, Georgia Institute of Technology
  • Office of the Director of National Intelligence
  • Intelligence Advanced Research Projects Activity
  • Army Research Office
Topics
  • Physical Sciences › Computer Science › Artificial Intelligence › Quantum Information and Cryptography
  • Physical Sciences › Physics and Astronomy › Atomic and Molecular Physics, and Optics › Cold Atom Physics and Bose-Einstein Condensates
  • Physical Sciences › Physics and Astronomy › Atomic and Molecular Physics, and Optics › Quantum Mechanics and Applications
Keywords
surface-electrode ion trap, X-junctions, microfabricated ion traps, ion transport, ion heating, Doppler cooling, ion loss, quantum information processors

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