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The experimental measurement of the thermal emissivity of a black coating from 50 K to 300 K

Zhang, S Y, Shen, F Z, Liu, H M, Huang, C J, Li, L F·2022·IOP Conference Series: Materials Science and Engineering

Abstract

High-emissivity coatings are commonly applied in satellite detectors and large-scale cryogenic systems. Accurate and quick measurement of emissivity is in high demand for practical applications at cryogenic temperatures. In this paper, a method for the measurement of the total hemispherical emissivity from 50 K to 300 K was presented based on the static calorimetric method. A two-stage GM cryocooler was used as a cooling source in the measuring device without assumption of cryogenic liquids. The thermal emissivity of a black carbon coating was measured by monitoring temperatures timely in the device. The tested results exhibited good accordance with previous reports. This cryogenic measurement device has made it a strong candidate for the radiative heat dissipation at cryogenic temperatures. Design details of the experiment and measurement results will be presented.

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  • The shift from liquid-cryogen baths to refrigeration-based cooling systems extends the lower limit of the measurable temperature range, enabling continuous emissivity testing across a broad temperature range.

    “This transition not only eliminates the operational challenges and resource consumption associated with continuous cryogen replenishment but also extends the lower limit of the measurable temperature range, enabling continuous emissivity testing across a broad temperature range [59].”

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Research works printed but not linked: 7

  1. Alekseev, 2019, Fusion Eng. Des., 146, 144, 10.1016/j.fusengdes.2018.12.002 · DOI
  2. Hanzelka, 2008, Cryogenics, 48, 455, 10.1016/j.cryogenics.2008.03.021 · DOI
  3. Králík, 2016, Metrologia, 53, 743, 10.1088/0026-1394/53/2/743 · DOI · Paper page
  4. Kralik, 2012, Phys. Rev. Lett., 109, 10.1103/PhysRevLett.109.224302 · DOI
  5. Tuttle, 2014, Cryogenics, 64, 240, 10.1016/j.cryogenics.2014.04.024 · DOI
  6. Tuttle, 2016, Cryogenics, 74, 166, 10.1016/j.cryogenics.2015.09.003 · DOI
  7. Wang, 2015, Nanoscale, 7, 7101, 10.1039/C5NR00719D · DOI

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Authors
Zhang, S. Y., Shen, F. Z., Liu, H. M., Huang, C. J., & Li, L. F.
Venue
IOP Conference Series: Materials Science and Engineering
Published
2022-05-01
Volume
1241
Issue
1
Pages
012053
ISSN
  • 1757-8981
  • 1757-899X
Cited by
3
References
0

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