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Piezoresistance Effect in Germanium and Silicon

Smith, Charles S.·1954·Physical Review

Abstract

Uniaxial tension causes a change of resistivity in silicon and germanium of both $n$ and $p$ types. The complete tensor piezoresistance has been determined experimentally for these materials and expressed in terms of the pressure coefficient of resistivity and two simple shear coefficients. One of the shear coefficients for each of the materials is exceptionally large and cannot be explained in terms of previously known mechanisms. A possible microscopic mechanism proposed by C. Herring which could account for one large shear constant is discussed. This so called electron transfer effect arises in the structure of the energy bands of these semiconductors, and piezoresistance may therefore give important direct experimental information about this structure.

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Metadata

Authors
Smith, C. S.
Venue
Physical Review
Published
1954-04-01
Volume
94
Issue
1
Pages
42-49
ISSN
0031-899X (ISSN-L)
OpenAlex
W2002257666
Cited by
2,036
References
0
FWCI
12.30
Type
journal article
Language
en
Open access
closed

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CoChat. (2026). Citation check: Piezoresistance Effect in Germanium and Silicon. https://app.cochat.ai/papers/10.1103/physrev.94.42
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Smith, C. S. (1954). Piezoresistance Effect in Germanium and Silicon. Physical Review. https://doi.org/10.1103/physrev.94.42

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Semantic Scholar’s data is described in: Kinney, R., et al. (2023). The Semantic Scholar Open Data Platform. arXiv:2301.10140.