The DOI matches its Crossref record; 6 of the 6 references it cites were found in a registry or an index.
Site effect on the impurity levels in4H,6H, and15RSiC
Abstract
The existence of site-dependent impurity levels caused by inequivalent sites in $4H$, $6H$, and $15R$ SiC has been verified from a study of configuration coordinate phonons. From analyses of donor-acceptor pair and free-to-acceptor luminescence, two kinds of impurity levels of A1, Ga, and B acceptors and N donors substituted cubic-like and hexagonal-like sites are determined. All the impurities in cubic-like sites take deeper levels than those in hexagonal-like sites. Ratios of the ionization energies are approximately constant independent of polytypes and the kind of impurities, 1.0-1.08 for acceptors and 1.55-1.88 for donors, in spite of a wide range of the ionization energies. The origin of the site effect on the impurity level is explained by assuming the existence of a local dielectric constant and a local effective mass. Haynes' rule is found to apply relatively well to N donors in different sites in various polytypes SiC.
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Citations
Cites
Experimental Proof of the Existence of a New Electronic Complex in Silicon
Haynes, J. R. (1960) · Physical Review Letters · doi:10.1103/physrevlett.4.361 · Cited by 614
Phonon Dispersion Curves by Raman Scattering in SiC, Polytypes3C,4H,6H,15R, and21R
Feldman, D. W., Parker, J. H., Choyke, W. J., & Patrick, L. (1968) · Physical Review · doi:10.1103/physrev.173.787 · Cited by 558
Static Dielectric Constant of SiC
Patrick, L., & Choyke, W. J. (1970) · Physical review. B, Solid state · doi:10.1103/physrevb.2.2255 · Cited by 271
Exciton Recombination Radiation and Phonon Spectrum of6HSiC
Choyke, W. J., & Patrick, L. (1962) · Physical Review · doi:10.1103/physrev.127.1868 · Cited by 201
Absorption of Light by Trapped Electrons
O'Rourke, R. C. (1953) · Physical Review · doi:10.1103/physrev.91.265 · Cited by 175
Application of quantum defect techniques to photoionization of impurities in semiconductors
Bebb, H. B., & Chapman, R. A. (1967) · Journal of Physics and Chemistry of Solids · doi:10.1016/0022-3697(67)90184-9 · Cited by 97
Cited by
Material Science and Device Physics in SiC Technology for High-Voltage Power Devices
Kimoto, T. (2015) · Japanese Journal of Applied Physics · doi:10.7567/jjap.54.040103 · Cited by 1,176
Metadata
- Authors
- Ikeda, M., Matsunami, H., & Tanaka, T.
- Venue
- Physical Review B
- Publisher
- American Physical Society (APS)
- Published
- 1980-09-15
- Volume
- 22
- Issue
- 6
- Pages
- 2842-2854
- ISSN
- 0163-1829 (ISSN-L)
- OpenAlex
- W2031264725
- Cited by
- 332
- References
- 6
- FWCI
- 0.56
- Type
- journal article
- Language
- en
- Open access
- closed
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- CoChat. (2026). Citation check: Site effect on the impurity levels in4H,6H, and15RSiC. https://app.cochat.ai/papers/10.1103/physrevb.22.2842
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- Ikeda, M., Matsunami, H., & Tanaka, T. (1980). Site effect on the impurity levels in4H,6H, and15RSiC. Physical Review B. https://doi.org/10.1103/physrevb.22.2842
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