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Correlation between antiferromagnetic interface coupling and positive exchange bias
Abstract
The induced moment in antiferromagnetic (AFM)--ferromagnetic (FM) $({\mathrm{FeF}}_{2}\ensuremath{-}\mathrm{Fe}$ and ${\mathrm{MnF}}_{2}\ensuremath{-}\mathrm{Fe})$ bilayers has been studied from the shift along the magnetization axis of the exchange-biased hysteresis loops. The magnetization shift depends strongly on the cooling field and microstructure of the AFM layer. The shift for small cooling fields can be opposite to the cooling field, indicating that, in some cases, the presence of the FM layer induces an antiferromagnetic coupling at the interface. Samples with negative magnetization shifts (antiferromagnetic coupling) exhibit large changes in exchange bias ${H}_{E}$ as a function of cooling field and positive exchange bias. Samples with positive magnetization shifts (ferromagnetic coupling) show almost no change in ${H}_{E}$ with cooling field and the exchange bias field remains always negative. These results confirm the theoretical assumption that an antiferromagnetic interface coupling is necessary to observe positive exchange bias.
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Cited by
Exchange bias in nanostructures
Nogués, J., Sort, J., Langlais, V., Skumryev, V., Suriñach, S., Muñoz, J. S., & Baró, M. D. (2005) · Physics Reports · doi:10.1016/j.physrep.2005.08.004 · Cited by 1,925
Self-citationControlling exchange bias in Fe3O4/FeO composite particles prepared by pulsed laser irradiation
Swiatkowska-Warkocka, Z., Kawaguchi, K., Wang, H., Katou, Y., & Koshizaki, N. (2011) · Nanoscale Research Letters · doi:10.1186/1556-276x-6-226 · Cited by 71
Metadata
- Authors
- Nogués, J., Leighton, C., & Schuller, I. K.
- Venue
- Physical Review B
- Publisher
- American Physical Society (APS)
- Published
- 2000-01-01
- Volume
- 61
- Issue
- 2
- Pages
- 1315-1317
- ISSN
- 0163-1829 (ISSN-L)
- 1095-3795
- OpenAlex
- W2056202339
- Cited by
- 266
- References
- 0
- FWCI
- 6.40
- Type
- journal article
- Language
- en
- Open access
- closed
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- Nogués, J., Leighton, C., & Schuller, I. K. (2000). Correlation between antiferromagnetic interface coupling and positive exchange bias. Physical Review B. https://doi.org/10.1103/physrevb.61.1315
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