Cited by 102Topological Materials and Phenomena2D Materials and ApplicationsSurface and Thin Film Phenomena

Scanning tunneling microscopy of defect states in the semiconductor Bi 2 Se 3

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Urazhdin, S., Bilc, D., Tessmer, S. H., Mahanti, S. D., Kyratsi, Theodora, Kanatzidis, M. G.·2002·Physical Review B

Abstract

Scanning tunneling spectroscopy images of ${\mathrm{Bi}}_{2}{\mathrm{Se}}_{3}$ doped with excess Bi reveal electronic defect states with a striking shape resembling clover leaves. With a simple tight-binding model, we show that the geometry of the defect states in ${\mathrm{Bi}}_{2}{\mathrm{Se}}_{3}$ can be directly related to the position of the originating impurities. Only the Bi defects at the Se sites five atomic layers below the surface are experimentally observed. We show that this effect can be explained by the interplay of defect and surface electronic structure.

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References 17 · Cited by 102

Authors
Urazhdin, S., Bilc, D., Tessmer, S. H., Mahanti, S. D., Kyratsi, T., & Kanatzidis, M. G.
Affiliations
Michigan State University (US)
Venue
Physical Review B
Published
2002-10-04
Volume
66
Issue
16
ISSN
  • 0163-1829 (ISSN-L)
  • 1095-3795
OpenAlex
W2125634383
Cited by
102
References
17
Citations by year
2026: 3 · 2025: 3 · 2024: 4 · 2022: 6 · 2021: 7 · 2020: 5 · 2019: 4 · 2018: 6 · 2017: 6 · 2016: 3 · 2015: 10 · 2014: 7 · 2013: 9 · 2012: 5
FWCI
0.44
Type
journal article
Language
en
Open access
Locations
  • Physical review. B, Condensed matter (publishedVersion)
  • arXiv (Cornell University) (submittedVersion)
  • arXiv (Cornell University)
Topics
  • Physical Sciences › Physics and Astronomy › Atomic and Molecular Physics, and Optics › Topological Materials and Phenomena
  • Physical Sciences › Materials Science › Materials Chemistry › 2D Materials and Applications
  • Physical Sciences › Physics and Astronomy › Atomic and Molecular Physics, and Optics › Surface and Thin Film Phenomena
Keywords
Bi2Se3, electronic defect states, bismuth doping, tight-binding model, surface electronic structure, defect geometry, topological insulators, scanning tunneling spectroscopy

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