Student or educator? Sign up with your school email and get 6 months of Pro free.
CoChat
Sign Up
Cited by 465

The DOI matches its Crossref record; 24 of the 24 references it cites were found in a registry or an index.

Effects of carrier concentration on the dielectric function of ZnO:Ga andIn2O3:Snstudied by spectroscopic ellipsometry: Analysis of free-carrier and band-edge absorption

Fujiwara, Hiroyuki, Kondo, Michio·2005·Physical Review B
DOI 10.1103/physrevb.71.075109
Open this paper in CoChat — free account

Abstract

We have determined the dielectric functions of ZnO:Ga and ${\mathrm{In}}_{2}{\mathrm{O}}_{3}:\mathrm{Sn}$ with different carrier concentrations by spectroscopic ellipsometry. The dielectric functions have been obtained from ellipsometry analyses using the Drude and Tauc-Lorentz models. With increasing Hall carrier concentration ${N}_{\text{Hall}}$ in a range from ${10}^{19}\phantom{\rule{0.3em}{0ex}}\text{to}\phantom{\rule{0.3em}{0ex}}{10}^{21}\phantom{\rule{0.3em}{0ex}}{\mathrm{cm}}^{\ensuremath{-}3}$, the dielectric functions of ZnO:Ga and ${\mathrm{In}}_{2}{\mathrm{O}}_{3}:\mathrm{Sn}$ show drastic changes due to increases in (i) free-carrier absorption in a low-energy region and (ii) the Burstein-Moss shift in a high-energy region. The analyses of the dielectric functions revealed reductions in high-frequency dielectric constant ${\ensuremath{\epsilon}}_{\ensuremath{\infty}}$ and increases in plasma energy ${E}_{\mathrm{p}}$ as ${N}_{\text{Hall}}$ in the films increases. From a set of the parameters $({N}_{\text{Hall}},\phantom{\rule{0.2em}{0ex}}{\ensuremath{\epsilon}}_{\ensuremath{\infty}},\phantom{\rule{0.2em}{0ex}}{E}_{\mathrm{p}})$ determined experimentally, effective mass ${m}^{*}$ of ZnO:Ga and ${\mathrm{In}}_{2}{\mathrm{O}}_{3}:\mathrm{Sn}$ is extracted. In contrast to previous studies, we found linear increases in ${m}^{*}$ with increasing ${N}_{\text{Hall}}$. When the variations of ${m}^{*}$ with carrier concentration are taken into account, carrier concentrations determined optically from spectroscopic ellipsometry show remarkable agreement with those estimated by Hall measurements. Nevertheless, the electron mobility obtained from spectroscopic ellipsometry and Hall measurements indicates rather poor agreement. We attributed this to the presence of grain boundaries in the films. In this article, we discuss various effects of carrier concentration on the optical properties of transparent conductive oxides.

Overview

The claims and statistics of this paper haven’t been checked yet.

Run the check — free, no account needed. It reads the open-access text and checks the sources it cites.

A few free checks a day · papers already verified open instantly · results are public

Integrity signals

Registry

Crossref · 10.1103/physrevb.71.075109

Cites

24 of 24 references verified0 citation errors · 0 not checkable

Statistics

Verification

Claims the paper makes

The claims and statistics of this paper haven’t been checked yet.

Run the check — free, no account needed. It reads the open-access text and checks the sources it cites.

A few free checks a day · papers already verified open instantly · results are public

Self-check

Percentages, sums and reported differences re-computed from the paper’s own numbers.

The self-check needs the paper’s full text.

Citations

Cites

Cited by

See all 465

Metadata

Authors
Fujiwara, H., & Kondo, M.
Venue
Physical Review B
Publisher
American Physical Society (APS)
Published
2005-02-15
Volume
71
Issue
7
ISSN
  • 1098-0121 (ISSN-L)
  • 1550-235X
DOI
10.1103/physrevb.71.075109
OpenAlex
W2027469453
Cited by
465
References
24
FWCI
6.85
Type
journal article
Language
en
Open access
closed

About these checks

Registry, retraction, Cites and statistics results are computed, not judged, with one exception: a printed reference that no index lists is read once by a model before it counts as a citation error. Claims are extracted by a model and kept only when their quote appears verbatim in the text; each cited source is then checked, with a model’s help, for whether it says what the claim relies on. Those verdicts can be wrong — read the claim’s quote and the cited source before relying on one.

Statistics and arithmetic are recomputed, not judged.

Confidence bands are shown only for fields calibrated on our annotated test set. None is calibrated yet, so no band is shown.

What counts as a claim ›How we measure confidence ›How we check this ›

Are you an author, or do you see a problem with this page? Request a review

Data sources

Bibliographic data: Semantic Scholar, OpenAlex, Crossref.

Contains information from the Semantic Scholar Academic Graph Datasets, made available under the ODC Attribution License (ODC-BY 1.0).

Semantic Scholar’s data is described in: Kinney, R., et al. (2023). The Semantic Scholar Open Data Platform. arXiv:2301.10140.