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Cited by 236

The DOI matches its Crossref record; 4 of the 4 references it cites were found in a registry or an index.

Spin memristive systems: Spin memory effects in semiconductor spintronics

Open access
Pershin, Yu. V., Di Ventra, M.·2008·Physical Review B

Abstract

Recently, in addition to the well-known resistor, capacitor, and inductor, a fourth passive circuit element, named memristor, has been identified following theoretical predictions. The model example used in such case consisted in a nanoscale system with coupled ionic and electronic transport. Here, we discuss a system whose memristive behavior is based entirely on the electron-spin degree of freedom, which allows for a more convenient control than the ionic transport in nanostructures. An analysis of time-dependent spin transport at a semiconductor/ferromagnet junction provides a direct evidence of memristive behavior. Our scheme is fundamentally different from previously discussed schemes of memristive systems and broadens the possible range of applications of semiconductor spintronics.

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Crossref · 10.1103/physrevb.78.113309

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Cites

  • The missing memristor found

    Strukov, D. B., Snider, G. S., Stewart, D. R., & Williams, R. S. (2008) · Nature · doi:10.1038/nature06932 · Cited by 11,828

  • Memristor—The Missing Circuit Element

    Chua, L. (1971) · IEEE Transactions on Circuit Theory · doi:10.1109/tct.1971.1083337 · Cited by 10,268 · cited 2×

    “for memristive behaviour3, it is clear that the semiconductor/half-metal junction is a current-controlled memristive system. This can be seen by comparing directly Eqs. (4) and (5) with Eqs. (1) and (2), respectively (we can certainly write Eq. (5) in terms of n discrete variables). In order to observe memristive beha…”
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  • Memristive switching mechanism for metal/oxide/metal nanodevices

    Yang, J. J., Pickett, M. D., Li, X., Ohlberg, D. A. A., Stewart, D. R., & Williams, R. S. (2008) · Nature Nanotechnology · doi:10.1038/nnano.2008.160 · Cited by 2,987

  • Memristive devices and systems

    Chua, L. O., & Kang, S. M. (1976) · Proceedings of the IEEE · doi:10.1109/proc.1976.10092 · Cited by 2,604 · cited 2×

    “bstituting Eqs. (8) and (9) into Eq. (4), we get i q t e f N N V sL c ⎥ ⎥ ⎥ ⎥ ⎦ ⎤ ⎢ ⎢ ⎢ ⎢ ⎣ ⎡ ⎟ ⎠ ⎞ ⎜ ⎝ ⎛ − = + ↑ ( ) 2 1 2 (0) ρ ρ0 . (10) It follows from Eq. (10), which is a particular case of Eq. (3), that the resistivity of the system depends only on the amount of charge q(t) flowing through it. 7 E-print arXiv:0…”
    BackgroundInfluential

Research works printed but not linked: 12

  1. 10.1103/PhysRevB.77.073301 · DOI
  2. 10.1103/PhysRevB.75.193301 · DOI
  3. 10.1140/epjb/e2002-00316-5 · doi:10.1140/epjb/e2002-00316-5
  4. 10.1103/PhysRevB.68.035340 · doi:10.1103/physrevb.68.035340
  5. 10.1103/PhysRevLett.88.066603 · DOI · Paper page
  6. 10.1126/science.1063186 · DOI
  7. 10.1126/science.1116865 · doi:10.1126/science.1116865
  8. 10.1063/1.1794893 · doi:10.1063/1.1794893
  9. 10.1103/PhysRevB.72.153301 · doi:10.1103/physrevb.72.153301
  10. 10.1103/PhysRevLett.98.046602 · DOI
  11. 10.1103/PhysRevB.66.201202 · DOI · Paper page
  12. D. L. Scharfetter, 1969, IEEE Trans. Electron Devices, ED-16, 64, 10.1109/T-ED.1969.16566 · DOI · Paper page

Cited by

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Metadata

Authors
Pershin, Y. V., & Di Ventra, M.
Venue
Physical Review B
Published
2008-09-23
Volume
78
Issue
11
ISSN
  • 1098-0121 (ISSN-L)
  • 1550-235X
OpenAlex
W1509810673
Cited by
236
References
4
FWCI
11.99
Type
journal article
Language
en
Open access
green

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